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ORCIDITC 1988: Washington, D.C., USA
- Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. IEEE Computer Society 1988, ISBN 0-8186-0870-6
Session 1: Plenary: Keynote Address and Invited Speakers
Keynote Speaker
- A. Blanton Godfrey:
Managing Quality : Today's Opportunities, Tomorrow's Challenges. ITC 1988: 1
Invited Speakers
- Lutz P. Henckels:
Scan Path and Beyond : The Road to Improved ASIC Testability. ITC 1988: 2 - Alberto L. Sangiovanni-Vincentelli:
Optimal Logic Synthesis and Testability : Two Sides of the Same Coin. 3-12
Session 2: New Advances in Test Hardware
- Sheng-Jen Tsai, Charles D. Hechtman:
GaAs Driver and Sensor for a High-Speed Test System. 13-22 - Christopher W. Branson, Don Murray, Steve Sullivan:
Integrated Pin Electronics for a VLSI Test System. 23-27 - J. R. Birchak, H. K. Haill:
Characteristic Impedance and Coupling Coefficients for Multilayer PC Boards. 28-38
Session 3: Board Test: New Problems and Applications
- Robert E. McAuliffe:
Practical Production Testing of ISDN Circuit Boards. 39-46 - Mark G. Karpovsky, Prawat Nagvajara:
Board-Level Diagnosis by Signature Analysis. 47-53 - Stephen Y. H. Su, Hede Ma:
Fault Isolation in Grey Systems. 54-63
Session 4: Testing Microprocessors: A Life Cycle's Work
- Catherine Bellon, Raoul Velazco, Haissam Ziade:
Analysis of Experimental Results on Functional Testing and Diagnosis of Complex Circuits. 64-72 - Hans Peter Klug:
Microprocessor Testing by Instruction Sequences Derived from Random Patterns. 73-80 - Janusz Sosnowski:
Detection of Control Flow Errors Using Signature and Checking Instructions. 81-88
Session 5: Software and Hardware Approaches to Fault Simulation
- Vinod Narayanan, Vijay Pitchumani:
: A Parallel Algorithm for Fault Simulation on the Connection Machine. 89-93 - Jean Paul Caisso, Bernard Courtois:
Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. 94-101 - Fumiyasu Hirose, Koichiro Takayama, Nobuaki Kawato:
A Method to Generate Tests for Combinational Logic Circuits Using an Ultra-High-Speed Logic Simulator. 102-107
Session 6: Ultimate: The Wave of the Future
- Teruo Tamama, Naoaki Narumi, Tai-ichi Otsuji, Masao Suzuki, Tsuneta Sudo:
Key Technologies for 500 MHz VLSI Test System "ULTIMATE". 108-113 - Tohru Adachi, M. Tanno, Tsuneta Sudo:
Software Environment for 500 MHz VLSI Test System "ULTIMATE". 114-119 - Yoshimitsu Sakagawa, Yusio Akazawa, Naoaki Narumi, Akira Yoshii, Tsuneta Sudo:
Packaging Technologies for the 500 MHz VLSI Test System "ULTIMATE". 120-125
Session 7: Boundary Scan and Test Bus
- Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski:
Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. 126-137 - Clay Gloster
, Franc Brglez:
Boundary Scan with Cellular-Based Built-In Self-Test. 138-145 - Matthias Gruetzner:
Design for Testability for Wafer-Scale Integration Interconnect Systems Design and Test Methodology. 146-152
Session 8: Test Features of Today's Microprocessors
- Theo J. Powell, Fred Hwang, Bill Johnson:
Testability Features in the TMS370 Family of Microcomputers. 153-160 - Luis A. Bonet:
Testability Features of a 32 Kbps ADPCM Transcoder. 161-171 - Yasuyuki Nozuyama, Akira Nishimura, Jun Iwamura:
Design for Testability of a 32-Bit Microprocessor, the TX1. 172-182
Session 9: Panel Session: What ist the Path to Fast Fault Simulation?
- Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, John A. Waicukauski:
What is the Path to Fast Fault Simulation? 183-192
Session 10: Panel Session: Componenent ATE Timing Accuracy Specifications: Can We Standardize?
- Marc Mydill:
Standardization of ATE Timing Accuracy Specifications. 193-194
Session 11: Panel Sesssion: Testability Standards
- Phil Collins:
Boundary Scan: The ATE Vendors' View. 195-196 - Pete Fleming:
Semiconductor Perspective on Test Standards. 197-198 - Charles R. Kime:
Impact of Testability Standards on University Research and Instruction. 199-200 - David J. Richards:
Value of Testability Standards in Testing Commercial Products. 201-202
Session 13: Panel Session Test Education: Linking Theory and Practice
- Edward J. McCluskey:
Practice and Theory. 203-204 - Samiha Mourad:
Digital Testing, Theory and Practice. 205-206 - Kenneth Rose:
Do the Designs Work ? 207-208
Session 14: High-Level Test Generation
- Stephen M. Lea, Nigel Brown, Tim Katz, Phil Collins:
Expert System for the Functional Test Program Generation of Digital Electronic Circuit Boards. 209-220 - Brian T. Murray, John P. Hayes:
Hierarchical Test Generation Using Precomputed Tests for Modules. 221-229 - Gerold Affs, Reiner W. Hartenstein, Andrea Wodtko:
The KARL/KARATE System: Automatic Test Pattern Generation Based on RT Level Descriptions. 230-235
Session 15: Weighted Pseudorandom Pattern Genereation for BIST
- Hans-Joachim Wunderlich:
Multiple Distributions for Biased Random Test Patterns. 236-244 - John A. Waicukauski, Eric Lindbloom:
Fault Detection Effectiveness of Weighted Random Patterns. 245-255 - Fardad Siavoshi:
WTPGA : A Novel Weighted Test Pattern Generation Approach for VLSI Built-In Self-Test. 256-262
Session 16: RAM Design for Test
- Dhiraj K. Pradhan, Nirmala R. Kamath:
RTRAM: Reconfigurable and Testable Multi-Bit RAM Design. 263-278 - Pinaki Mazumder:
An On-Chip Double-Bit Error-Correcting Code for Three-Dimensional Dynamic Random-Access Memory. 279-288 - Steve Grennan:
Application of a Commercial Data Base Management System to Memory Device Test Program Generation and Debugging. 289-294
Session 17: Quality, Yield, and the Cost of Test
- Edward J. McCluskey, Fred Buelow:
IC Quality and Test Transparency. 295-301 - Chris Salzmann, Martin Funcell, Richard Taylor:
Design for Test and the Cost of Quality. 302-307 - W. David Ballew, Lauren M. Streb:
Elimination of Incoming Test Based Upon In-Process Failure and Repair Costs. 308-313
Session 19: Design and Evaluation of Signature Analysis Based BIST
- Henry Cox, André Ivanov, Vinod K. Agarwal, Janusz Rajski:
On Multiple Fault Coverage and Aliasing Probability Measures. 314-321 - Jacob Savir, William H. McAnney:
Identification of Failing Tests with Cycling Registers. 322-328 - Sandeep K. Gupta, Dhiraj K. Pradhan:
A New Framework for Designing and Analyzing BIST Techniques: Computation of Exact Aliasing Probability. 329-342
Session 20: SRAM Test Methods
- Frans P. M. Beenker, Rob Dekker, Loek Thijssen:
Fault Modeling and Test Algorithm Development. 343-352 - Frans P. M. Beenker, Rob Dekker, Loek Thijssen:
A Realistic Self-Test Machine for Static Random Access Memories. 353-361 - Manuel J. Raposa:
Dual Port Static RAM Testing. 362-368
Session 21: Reliability Test Detection Strategies
- A. P. Dorey, B. K. Jones, Andrew Mark David Richardson, P. C. Russell, Y. Z. Xu:
Reliability Testing by Precise Electrical Measurement. 369-373 - Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami:
Fault Detection of Combinational Circuits Based on Supply Current. 374-380 - Birger Schneider, Peter Oestergaard:
An Advanced Data Compaction Approach for Test During Burn-In. 381-390
Session 22: Board Test Technology and Practice
- Charles D. Hechtman:
In-Circuit Test Fixture. 391-400 - Luis Balme, Anne Mignotte, Jean-Yves Monari, Patrick Pondaven, Christophe Vaucher:
New Testing Equipment for SMT PC Boards. 401-410 - John Arena:
Evaluating the Limitations of High-Speed Board Testers. 411-420
Session 23: BIST Control and Test Scheduling
- John Y. Sayah, Charles R. Kime:
: Test Scheduling for High Performance VLSI System Implementations. 421-430 - Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien:
Concurrent Control of Multiple BIT Structures. 431-442 - C. Mani Krishna, Yann-Hang Lee:
Optimal Scheduling of Signature Analysis for VLSI Testing. 443-451
Session 24: CAE and Workstations I
- John Ivie:
A High Level Approach to Integrating Design and Test. 452-459 - Ji-en Morris Chang, William T. Krakow:
Optimal Use of Timing Resources: A Crucial Step in Test Program Generation. 460-465 - Cristopher Merritt:
A Strategy for Generating Functional Tests from Device Simulations. 466-474
Session 25: Realistic Defects and Their Impact on Shipped Quality
- John Paul Shen, F. Joel Ferguson:
Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis. 475-484 - Michael Demjanenko, Shambhu J. Upadhyaya:
Dynamic Techniques for Yield Enhancement of Field Programmable Logic Arrays. 485-491 - Eun Sei Park, Thomas W. Williams, M. Ray Mercer:
Statistical Delay Fault Coverage and Defect Level for Delay Faults. 492-499
Session 26: Panel Session: High Frequency DUT-Tester Interconnection Problems
- Bernd Reichelmann:
Contactors for Testing at High Frequencies. 500-501
Session 27: Implementation and Analysis of BIST
- Melvin A. Breuer, Jung-Cheun Lien:
A Test and Maintenance Controller for a Module Containing Testable Chips. 502-513 - Mehdi Katoozi, Mani Soma:
A BIST Design of Structured Arrays with Fault-Tolerant Layout. 514-521 - Jon G. Udeli Jr.:
Reconfigurable Hardware for Pseudo-Exhaustive Test. 522-530 - David L. Landis, Daniel C. Muha:
Evaluation of System BIST Using Computational Performance Measures. 531-536
Session 28: CAE and Workstations II
- Arthur E. Downey, Kazuhiko Matsuda:
Some New Techniques in Waveshape Capture and Analysis. 537-546 - Patrick M. Powers:
A High-Resolution Waveform Analysis Tool. 547-550 - Cihan Tinaztepe, Bülent Özgüç:
Functional Test Program Generation Through interactive Graphics. 551-558 - Yuichi Kawabata, Masami Maruyama, Al Tejeda:
PGTOOL: An Automatic Interactive Program Generation Tool for Testing New-Generation Memory Devices. 559-568
Session 29: Advances in Ffault Simulation and Fault Modeling
- William H. Nicholls, Mani Soma:
Fault Bundling: Reducing Machine Evaluation Activity in Hierarchical Concurrent Fault Simulation. 569-573 - Deborah Machlin, David Gross, Sudhir Kadkade, Ernst G. Ulrich:
Switch-Level Concurrent Fault Simulation Based on a General Purpose List Traversal Mechanism. 574-581 - Steven P. Smith, Bill Underwood, M. Ray Mercer:
D^3FS: A Demand Driven Deductive Fault Simulator. 582-592 - Tapan J. Chakraborty, Sumit Ghosh:
On Behavior Fault Modeling for Combinational Digital Designs. 593-600
Session 30: High-Speed Probing
- Brian Leslie, Farid Matta:
Membrane Probe Card Technology (the Future for High Performance Wafer Test). 601-607 - C. Barsotti, S. Tremaine, M. Bonham:
Very High Density Probing. 608-614 - T. Roland Fredriksen, David Grano:
New Automated Prober Support for High Pincount Test Heads. 615-620
Session 31: Design for Testability I
- Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli:
Synthesis and Optimization Procedures for Fully and Easily Testable Sequential Machines. 621-630 - Desmond F. D'Souza:
A Knowledge Representation Scheme for DFT. 631-641 - Hideo Fujiwara, Osamu Fujisawa, Kazunori Hikone:
Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique. 642-648
Session 32: Testing ASICs
- Gary D. Culbertson:
Managing the ASIC Design to Test Process. 649-656 - Eric Archambeau, Ken Van Egmond:
Built-In Test Compiler in an ASIC Environment. 657-664 - A. Walter, Y. Kleinman, L. Edelshteyn, Jeff Gartner:
An Expert Test Program Generation System for Per-Pin Testers. 665-668
Session 33: Test Generation: Techniques
- Samy Makar, Edward J. McCluskey:
On the Testing of Multiplexers. 669-679 - Sandip Kundu, Sudhakar M. Reddy:
Robust Tests for Parity Trees. 680-687 - Henry Cox, Janusz Rajski:
Stuck-Open and Transition Fault Testing in CMOS Complex Gates. 688-694
Session 34: Novel Test Techniques Using Optics
- G. Tremblay, P. Meyrueix, J. C. Peuzin:
Optical Testing of Printed Circuit Boards. 695-699 - Francois J. Henley, Hee-June Choi:
Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System. 700-709 - Dean J. Kratzer, Steve Barton, Francois J. Henley, David A. Plomgrem:
High-Speed Pattern Generator and GaAs Pin : Electronics for a Gigahertz Production Test System. 710-718
Session 35: Design for Testability II
- M. M. Pradhan, E. J. O'Brien, S. L. Lam, James Beausang:
Circular BIST with Partial Scan. 719-729 - Hi-Keung Tony Ma, A. Richard Newton, Srinivas Devadas, Alberto L. Sangiovanni-Vincentelli:
An Incomplete Scan Design Approach to Test Generation for Sequential Machines. 730-734 - S. Bhawmick, M. S. Khaira, P. P. Mishra, A. Das, A. Dasgupta, P. Palchaudhury:
Threading of Multiple Scan Paths in a VLSI Circuit. 735-743
Session 36: Mixed-Signal Testing
- John Beck, James Pappas, Robert Rose, Larry Seiler:
Integrated Test Logic for Video ICs. 744-751 - John L. Russo:
Flexible Deep Memory Architecture Aids Program Development. 752-754 - Eric Rosenfeld:
Timing Generation for DSP Testing. 755-763
Session 37: Test Generation: Algorithms
- Gabriel M. Silberman, Ilan Y. Spillinger:
G-RIDDLE : A Formal Analysis of Logic Designs Condiucive to the Acceleration of Backtracing. 764-772 - Steven D. Millman, Edward J. McCluskey:
Detecting Bridging Faults with Stuck-at Test Sets. 773-783 - Markus Robinson, Janusz Rajski:
An Algorithmic Branch and Bound Method for PLA Test Pattern Generation. 784-795
Session 38: Process Improvement: Data in Action
- Chi W. Yau, Song-Lin Chang, Bruce F. Jordan, Joe J. Schwermann, Joan A. Wellman:
Trouble-Shooting: A Key to Process Improvement. 796-803 - Raymond J. Balzer, Greg A. Larsen:
Predicting and Obtaining High Final Test Yields. 804-815 - Neil Hutchinson:
CIM , Electronics Manufacturing and ATE. 816-822
Session 39: Analog Design for Testability
- Kenneth D. Wagner, Thomas W. Williams:
Design for Testability of Mixed Signal Integrated Circuits. 823-828 - Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff:
TASTE: A Tool for Analog System Testability Evaluation. 829-838 - M. J. Marlett, Jacob A. Abraham:
DC_IATP : An Iterative Analog Circuit Test Generation Program for Generating DC Single Pattern Tests. 839-844
Session 40: Test Generation: Delay Testing
- Ankan K. Pramanick, Sudhakar M. Reddy:
On the Detection of Delay Faults. 845-856 - Vijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger:
Delay Test Generation 1: Concepts and Coverage Metrics. 857-866 - Vijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger:
Delay Test Generation 2: Algebra and Algorithms. 867-876
Session 41: Systems Test I
- Stephen R. Demba, Ernst G. Ulrich, Karen Panetta, David Giramma:
Experiences with Concurrent Fault Simulation of Diagnostic Programs. 877-883 - Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba:
System Level Fault Dictionary Generation. 884-887 - Stephen Y. H. Su, Hede Ma:
Designs for Diagnosability and Reliability in VLSI Systems. 888-897
Session 42: E-Beam Concepts
- M. Melgara, M. Battu, P. Garino, J. Dowe, Y. J. Vernay, M. Marzouki, Francis M. Boland:
Automatic Location of IC Design Errors Using Beam System. 898-907 - Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum:
Electron Beam Tester Integrated into a VLSI Tester. 908-913
Session 43: Concurrent BIST Techniques
- Kent D. Wilken, John Paul Shen:
Continuous Signature Monitoring: Efficient Concurrent-Detection of Processor Control Errors. 914-925 - Lawrence P. Holmquist, Larry L. Kinney:
Error Detection with Latency in Sequential Circuits. 926-933 - Leon J. Sigal, Charles R. Kime:
Concurrent Off-Phase Built-in Self-Test of Dormant Logic. 934-941
Session 44: VLSI Processor Test: Techniques and Technology
- Mark Marshall:
Techniques for User Testing of the 68882. 942-947 - Kenneth R. Stuchlik:
Simultaneous Switching Noise Evaluation of Advanced CMOS Logic (ACL). 948-957 - Douglas B. Arnett, K. S. Bhaskar:
Emulative Testing at the Bus Speed Limit. 958-968
Session 45: Systems Test II
- Donald H. Merliho, John Hadjilogiou:
Built-In Test Strategy for Next Generation Military Avionic Hardware. 969-975 - Bulent I. Dervisoglu:
Using Scan Technology for Debug and Diagnostics in a Workstation Environment. 976-986 - Mike Ricchetti, John Hoglund:
Scan Diagnostic Strategy for the Series 10000 Prism Workstation. 987-992
Poster Session
- Jill J. Hallenbeck, Nick Kanopoulos, Nagesh Vasanthavada, James W. Watterson:
CAD Tools for Supporting System Design for Testability. 993 - Cuong Bui:
Testability Using Random Access Test Register. 994-995 - Michael Treseler:
Designing State Machines for Testability. 996 - Samiha Mourad, Edward J. McCluskey:
On Benchmarking Digital Testing Systems. 997 - Peter N. Marinos:
The Non-Linear Feedback Shift-Register as a Built-In Self-Test (BIST) Resource. 998 - David Stannard, Bozena Kaminska:
Detection of Hard Faults in a Combinational Circuit Using Budget Constraints. 999 - Jon G. Udeli Jr., Edward J. McCluskey:
Partial Hardware Partitioning: A New Pseudo-Exhaustive Test Implementation. 1000 - Sami A. Al-Arian, Kevin A. Kwiat:
Defining a Standard for Fault Simulator Evaluation. 1001 - G. J. Hill, B. C. Roberts, C. P. Strudwick:
Determination of Safe Back-Driving Currents in Bond Wires and Dice. 1002
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