"A Test and Maintenance Controller for a Module Containing Testable Chips."

Melvin A. Breuer, Jung-Cheun Lien (1988)

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DOI: 10.1109/TEST.1988.207830

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Melvin A. Breuer, Jung-Cheun Lien:
A Test and Maintenance Controller for a Module Containing Testable Chips. ITC 1988: 502-513

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