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2010 – 2019
- 2016
[c68]Mani Soma, Tong Zhang, Jacques Christophe Rudell:
Statistical computational methods for mixed-signal performance metrics under process variations and noise models. NEWCAS 2016: 1-4- 2015
- [c67]Mani Soma:
On-line detection of intermittent faults in digital-to-analog converters. DFTS 2015: 66-71 - [c66]Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma:
A new method for measuring alias-free aperture jitter in an ADC output. ITC 2015: 1-6 - 2014
- [c65]Mani Soma:
Analog fault models: Back to the future? ITC 2014: 1 - [c64]Allan Ecker, Mani Soma:
A method for phase noise extraction from data communication. VTS 2014: 1-6 - [c63]Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li:
Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. VTS 2014: 1 - 2013
- [j20]Sergio Callegari
, Fabio Pareschi, Gianluca Setti, Mani Soma:
On the usage of resonate and fire dynamics in the complex oscillation-based test approach. Int. J. Circuit Theory Appl. 41(12): 1290-1317 (2013) - 2012
- [c62]Allan Ecker, Kenneth Blakkan, Mani Soma:
A digital method for phase noise measurement. ITC 2012: 1-10 - 2011
- [c61]Sergio Callegari, Fabio Pareschi, Gianluca Setti, Mani Soma:
Resonate and fire dynamics in Complex Oscillation Based Test of analog filters. ISCAS 2011: 1331-1334 - [c60]Takahiro J. Yamaguchi, Mohamed Abbas, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Satoshi Komatsu, Kunihiro Asada:
An equivalent-time and clocked approach for continuous-time quantization. ISCAS 2011: 2529-2532 - [c59]Takahiro J. Yamaguchi, Mani Soma, Takafumi Aoki, Yasuo Furukawa, Katsuhiko Degawa, Kunihiro Asada, Mohamed Abbas, Satoshi Komatsu:
Application of a continuous-time level crossing quantization method for timing noise measurements. ITC 2011: 1-10 - 2010
- [j19]Sergio Callegari, Fabio Pareschi, Gianluca Setti, Mani Soma:
Complex Oscillation-Based Test and Its Application to Analog Filters. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(5): 956-969 (2010)
2000 – 2009
- 2009
- [c58]Sergio Callegari, Gianluca Setti, Mani Soma:
Complex Oscillation Based Test of Analog Filters. ISCAS 2009: 2854-2857 - [c57]Kenneth Blakkan, Mani Soma:
A Time Domain Method to Measure Oscillator Phase Noise. VTS 2009: 297-302 - 2008
- [c56]Mani Soma:
Enhancing industry participation in ISCAS and Circuits and Systems Society. ISCAS 2008 - [c55]Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa:
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. ITC 2008: 1-9 - [c54]Apurva Mishra, Mani Soma:
A Time-Domain Method for Pseudo-Spectral Characterization. VTS 2008: 163-168 - 2007
- [c53]Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter. CICC 2007: 161-164 - [c52]Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter. ISCAS 2007: 2798-2801 - [c51]Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
Data jitter measurement using a delta-time-to-voltage converter method. ITC 2007: 1-7 - [c50]Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma:
An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time. ITC 2007: 1-8 - 2006
- [j18]Qi Wang, Yi Tang, Mani Soma:
Method to measure RF transceiver bandwidth in the time domain. IEEE Trans. Instrum. Meas. 55(3): 982-988 (2006) - [c49]Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement. ITC 2006: 1-8 - [c48]Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma:
A Study of Per-Pin Timing Jitter Scope. ITC 2006: 1-7 - [c47]Qi Wang, Mani Soma:
RF Front-end System Gain and Linearity Built-in Test. VTS 2006: 228-233 - 2005
- [j17]Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz:
Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. IEEE Trans. Instrum. Meas. 54(3): 975-987 (2005) - [c46]David Bordoley, Hieu Nguyen, Mani Soma:
A statistical study of the effectiveness of BIST jitter measurement techniques. ICCAD 2005: 100-107 - [c45]Mani Soma:
Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither? ITC 2005: 1 - [c44]Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma:
A wideband low-noise ATE-based method for measuring jitter in GHz signals. ITC 2005: 10 - 2004
- [j16]Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida:
Skew measurements in clock distribution circuits using an analytic signal method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(7): 997-1009 (2004) - [c43]Bryan Nelson, Mani Soma:
On-chip calibration technique for delay line based BIST jitter measurement. ISCAS (1) 2004: 944-947 - [c42]Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Christian Krawinkel, Katsuaki Ohsawa, Masao Sugai:
A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems. ITC 2004: 77-84 - [c41]Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry C. Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz:
Experimental Results for High-Speed Jitter Measurement Technique. ITC 2004: 85-94 - [c40]Qi Wang, Yi Tang, Mani Soma:
GHz RF Front-end Bandwidth Time Domain Measurement. VTS 2004: 223-228 - 2003
- [j15]Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha:
Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division. J. Electron. Test. 19(2): 183-193 (2003) - [j14]Kianosh Rahimi, Mani Soma:
Layout driven synthesis of multiple scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 317-326 (2003) - [j13]Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe, Tadahiro Ohmi:
Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method. IEEE Trans. Circuits Syst. II Express Briefs 50(6): 288-298 (2003) - [c39]Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha:
Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements. ITC 2003: 58-66 - [c38]Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz:
CMOS Built-In Test Architecture for High-Speed Jitter Measurement. ITC 2003: 67-76 - [c37]Mani Soma, Welela Haileselassie, Jessica Sherrid:
Measurement of Phase and Frequency Variations in Radio-Frequency Signal. VTS 2003: 203-208 - 2002
- [c36]Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Hirobumi Musha:
Effects of Amplitude Modulation in Jitter Tolerance Measurements of Communication Devices. Asian Test Symposium 2002: 45-48 - [c35]Mani Soma, Welela Haileselassie, Jessica Yan, Rajesh Raina:
A Wavelet-Based Timing Parameter Extraction Method. ITC 2002: 120-128 - [c34]Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie:
A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter. ITC 2002: 717-725 - [c33]Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Louis Malarsie, Hirobumi Musha:
Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division. VTS 2002: 207-212 - 2001
- [j12]Mani Soma, Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg:
Hierarchical ATPG for Analog Circuits and Systems. IEEE Des. Test Comput. 18(1): 72-81 (2001) - [c32]Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida:
Testing clock distribution circuits using an analytic signal method. ITC 2001: 323-331 - [c31]Seongwon Kim, Mani Soma:
Test evaluation and data on defect-oriented BIST architecture for high-speed PLL. ITC 2001: 830-837 - [c30]Mani Soma:
Mixed-signal RF Design-for-Test: Is It R (Real) or F (Fake)? LATW 2001: 107 - [c29]Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, David Halter, Rajesh Raina, Jim Nissen:
A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals. VTS 2001: 102-110 - [c28]Henry Chang, Steve Dollens, Gordon W. Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham:
Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? VTS 2001: 415-416 - 2000
- [c27]Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe:
Jitter measurements of a PowerPCTM microprocessor using an analytic signal method. ITC 2000: 955-964 - [c26]Seongwon Kim, Mani Soma, Dilip Risbud:
An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. VTS 2000: 231-236 - [c25]Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi:
Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method. VTS 2000: 395-402
1990 – 1999
- 1999
- [j11]Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh:
Test set selection for structural faults in analog IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7): 1026-1039 (1999) - [c24]Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma:
Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. Asian Test Symposium 1999: 239- - [c23]Cecilia Metra, Flavio Giovanelli, Mani Soma, Bruno Riccò:
Self-checking scheme for very fast clocks' skew correction. ITC 1999: 652-661 - [c22]Mani Soma:
Panel Statement: Increasing test coverage in a VLSI design course. ITC 1999: 1136 - [c21]Jinyan Zhang, Sam D. Huynh, Mani Soma:
A Test Point Insertion Algorithm for Mixed-Signal Circuits. VTS 1999: 319-325 - 1998
- [j10]Mani Soma:
Mixed-signal on-chip timing measurements. Integr. 26(1-2): 151-165 (1998) - [c20]Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang:
Dynamic Test Set Generation for Analog Circuits and Systems. Asian Test Symposium 1998: 360-365 - [c19]Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang:
Testability analysis and multi-frequency ATPG for analog circuits and systems. ICCAD 1998: 376-383 - 1997
- [j9]Heung-Joon Park, Mani Soma:
Analytical model for switching transitions of submicron CMOS logics. IEEE J. Solid State Circuits 32(6): 880-889 (1997) - [j8]Yong Je Lim, Mani Soma:
Statistical estimation of delay-dependent switching activities in embedded CMOS combinational circuits. IEEE Trans. Very Large Scale Integr. Syst. 5(3): 309-319 (1997) - [c18]Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190 - [c17]Takahiro J. Yamaguchi, Mani Soma:
Dynamic Testing of ADCs Using Wavelet Transforms. ITC 1997: 379-388 - [c16]Thomas M. Bocek, Tuyen D. Vu, Mani Soma, Jason D. Moffatt:
Experimental Results for Current-Based Analog Scan. ITC 1997: 768-775 - 1996
- [c15]Yong Je Lim, Kyung-Im Son, Heung-Joon Park, Mani Soma:
A Statistical Approach to the Estimation of Delay Dependent Switching Activities in CMOS Combinational Circuits. DAC 1996: 445-450 - [c14]Giri Devarayanadurg, Prashant Goteti, Mani Soma:
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs. ITC 1996: 521-527 - 1995
- [c13]Giri Devarayanadurg, Mani Soma:
Dynamic test signal design for analog ICs. ICCAD 1995: 627-630 - 1994
- [c12]Giri Devarayanadurg, Mani Soma:
Analytical fault modeling and static test generation for analog ICs. ICCAD 1994: 44-47 - [c11]Mani Soma, Vladimir Kolarik:
A design-for-test technique for switched-capacitor filters. VTS 1994: 42-47 - 1993
- [j7]Mani Soma:
Guest editor's introduction. J. Electron. Test. 4(4): 297-298 (1993) - [c10]Mani Soma:
Fault Coverage of DC Parametric Tests for Embedded Analog Amplifiers. ITC 1993: 566-573 - [c9]Anchada Charoenrook, Mani Soma:
Fault Diagnosis of Flash ADC using DNL Test. ITC 1993: 680-689 - 1992
- [j6]Mani Soma:
Guest Editor's Introduction: Mixing Analog and Digital Systems. IEEE Des. Test Comput. 9(1): 6-7 (1992) - 1991
- [c8]Mani Soma:
Probabilistic measures of fault equivalence in mixed-signal systems. VTS 1991: 67-70 - 1990
- [j5]Mehdi Katoozi, Mani Soma:
Built-in test of CMOS state machines with realistic faults: a system perspective. IEEE J. Solid State Circuits 25(2): 482-489 (1990) - [j4]Mani Soma:
A package design technique for size reduction of implantable bioelectronic systems. IEEE Trans. Biomed. Eng. 37(5): 482-488 (1990) - [c7]Mani Soma:
A design-for-test methodology for active analog filters. ITC 1990: 183-192 - [c6]William H. Nicholls, Arnold W. Nordsieck, Mani Soma:
Experimental evaluation of concurrent fault simulation algorithms on scalable, hierarchically defined test cases. ITC 1990: 698-705 - [c5]Tsu-Wei Ku, Mani Soma:
Minimal overhead modification of iterative logic arrays for C-testability. ITC 1990: 964-969 - [c4]Mani Soma, Thomas Alexander:
Mixed digital/analog VLSI array architectures for image processing. VCIP 1990
1980 – 1989
- 1989
- [c3]Mani Soma:
A circuit model for the adaptive properties of neural networks. SMC 1989: 895-898 - 1988
- [c2]Mehdi Katoozi, Mani Soma:
A BIST Design of Structured Arrays with Fault-Tolerant Layout. ITC 1988: 514-521 - [c1]William H. Nicholls, Mani Soma:
Fault Bundling: Reducing Machine Evaluation Activity in Hierarchical Concurrent Fault Simulation. ITC 1988: 569-573 - 1987
- [j3]Douglas C. Galbraith, Mani Soma, Robert L. White:
A Wide-Band Efficient Inductive Transdennal Power and Data Link with Coupling Insensitive Gain. IEEE Trans. Biomed. Eng. 34(4): 265-275 (1987) - [j2]Mani Soma, Douglas C. Galbraith, Robert L. White:
Radio-Frequency Coils in Implantable Devices: Misalignment Analysis and Design Procedure. IEEE Trans. Biomed. Eng. 34(4): 276-282 (1987) - [j1]Jay T. Rubinstein, Francis A. Spelman, Mani Soma, Michael F. Suesserman:
Current Density Profiles of Surface Mounted and Recessed Electrodes for Neural Prostheses. IEEE Trans. Biomed. Eng. 34(11): 864-875 (1987)
Coauthor Index
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