"Testability analysis and multi-frequency ATPG for analog circuits and systems."

Sam D. Huynh et al. (1998)

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DOI: 10.1145/288548.289057

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/HuynhKSZ98
Sam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang:
Testability analysis and multi-frequency ATPG for analog circuits and systems. ICCAD 1998: 376-383

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