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2020 – today
- 2023
[c30]Tim Schopf
, Karim Arabi, Florian Matthes:
Exploring the Landscape of Natural Language Processing Research. RANLP 2023: 1034-1045- [i1]Tim Schopf, Karim Arabi, Florian Matthes:
Exploring the Landscape of Natural Language Processing Research. CoRR abs/2307.10652 (2023) - 2021
- [c29]Karim Arabi:
Edge Computing Trends, Design and Test Challenges - Keynote. VTS 2021
2010 – 2019
- 2015
- [c28]Karim Arabi, Kambiz Samadi, Yang Du:
3D VLSI: A Scalable Integration Beyond 2D. ISPD 2015: 1-7 - [c27]Karim Arabi:
Brain-inspired computing. ITC 2015: 7 - 2014
- [c26]Karim Arabi:
Low power design techniques in mobile processes. ISLPED 2014: 1-2 - 2011
- [c25]Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma:
Leakage power profiling and leakage power reduction using DFT hardware. VTS 2011: 46-51 - 2010
- [j10]Karim Arabi:
Guest Editorial. J. Electron. Test. 26(1): 5 (2010) - [c24]Karim Arabi:
Special session 6C: New topic mixed-signal test impact to SoC commercialization. VTS 2010: 212 - [c23]Karim Arabi:
Power noise and its impact on production test and validation of SoC devices. VTS 2010: 285
2000 – 2009
- 2008
- [j9]Xiongfei Meng, Resve A. Saleh, Karim Arabi:
Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1581-1588 (2008) - 2007
- [j8]Karim Arabi, Resve A. Saleh, Xiongfei Meng:
Power Supply Noise in SoCs: Metrics, Management, and Measurement. IEEE Des. Test Comput. 24(3): 236-244 (2007) - [c22]Xiongfei Meng, Karim Arabi, Resve A. Saleh:
A Novel Active Decoupling Capacitor Design in 90nm CMOS. ISCAS 2007: 657-660 - 2006
- [c21]Xiongfei Meng, Resve A. Saleh, Karim Arabi:
Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology. ISQED 2006: 266-271 - 2004
- [c20]Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha:
Mixed RL-Huffman encoding for power reduction and data compression in scan test. ISCAS (2) 2004: 681-684 - 2003
- [c19]Bozena Kaminska, Karim Arabi:
Mixed Signal DFT: A Concise Overview. ICCAD 2003: 672-680 - [c18]Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur:
Overview of the IEEE P1500 Standard. ITC 2003: 988-997 - 2002
- [c17]Karim Arabi:
Mixed-Signal BIST: Fact or Fiction. ITC 2002: 1202 - [c16]Karim Arabi:
Logic BIST and Scan Test Techniques for Multiple Identical Blocks. VTS 2002: 60-68 - [c15]Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei:
Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268 - 2001
- [j7]Mustapha Slamani, Karim Arabi:
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. J. Electron. Test. 17(5): 417-425 (2001)
1990 – 1999
- 1999
- [j6]Karim Arabi, Bozena Kaminska:
Oscillation-test methodology for low-cost testing of active analog filters. IEEE Trans. Instrum. Meas. 48(4): 798-806 (1999) - 1998
- [j5]Karim Arabi, Bozena Kaminska:
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. J. Electron. Test. 12(1-2): 93-99 (1998) - [j4]Karim Arabi, Bozena Kaminska:
Design for testability of embedded integrated operational amplifiers. IEEE J. Solid State Circuits 33(4): 573-581 (1998) - [j3]Karim Arabi, Bozena Kaminska, Mohamad Sawan:
On chip testing data converters using static parameters. IEEE Trans. Very Large Scale Integr. Syst. 6(3): 409-419 (1998) - [c14]Hassan Ihs, Karim Arabi, Bozena Kaminska:
Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation. ICCD 1998: 40-46 - [c13]Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100 - 1997
- [j2]Karim Arabi, Bozena Kaminska:
Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(7): 745-753 (1997) - [c12]Karim Arabi, Bozena Kaminska:
Efficient and accurate testing of analog-to-digital converters using oscillation-test method. ED&TC 1997: 348-352 - [c11]Karim Arabi, Bozena Kaminska:
Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. ICCD 1997: 462-467 - [c10]Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190 - [c9]Karim Arabi, Bozena Kaminska:
Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing. ITC 1997: 578-586 - [c8]Karim Arabi, Bozena Kaminska:
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. ITC 1997: 786-795 - [c7]Karim Arabi, Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171 - 1996
- [j1]Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
BIST for D/A and A/D Converters. IEEE Des. Test Comput. 13(4): 40-49 (1996) - [c6]Karim Arabi, Bozena Kaminska, Stephen K. Sunter:
Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45 - [c5]Mohamad Sawan, S. Robin, B. Provost, Y. Eid, Karim Arabi:
A wireless implantable electrical stimulator based on two FPGAs. ICECS 1996: 1092-1095 - [c4]Mehdi Ehsanian, Bozena Kaminska, Karim Arabi:
A new digital test approach for analog-to-digital converter testing. VTS 1996: 60-65 - [c3]Karim Arabi, Bozena Kaminska:
Oscillation-test strategy for analog and mixed-signal integrated circuits. VTS 1996: 476-482 - 1995
- [c2]Jieyan Zhu, Mohamad Sawan, Karim Arabi:
An Offset Compensated CMOS Current-Feedback Operational-Amplifier. ISCAS 1995: 1552-1555 - 1994
- [c1]Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494
Coauthor Index
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