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ORCIDED&TC 1997: Paris, France
- European Design and Test Conference, ED&TC '97, Paris, France, 17-20 March 1997. IEEE Computer Society 1997, ISBN 0-8186-7786-4
System Analysis Techniques and Applications
- Ali Dasdan, Anmol Mathur, Rajesh K. Gupta:
RATAN: A tool for rate analysis and rate constraint debugging for embedded systems. 2-6 - Preeti Ranjan Panda, Nikil D. Dutt
, Alexandru Nicolau:
Efficient utilization of scratch-pad memory in embedded processor applications. 7-11 - Pierre Girodias, Eduard Cerny:
Interface timing verification with delay correlation using constraint logic programming. 12-19
Sequential ATPG
- Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Sequential circuit test generation using dynamic state traversal. 22-28 - A. Dargelas, C. Gauthron, Yves Bertrand:
MOSAIC: a multiple-strategy oriented sequential ATPG for integrated circuits. 29-36 - Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
New static compaction techniques of test sequences for sequential circuits. 37-43
Design and Design Methodology for Analog Circuits
- Philippe Bénabès, Mansour Keramat, Richard Kielbasa:
A methodology for designing continuous-time sigma-delta modulators. 46-50 - Guo-Neng Lu, Gerard Sou:
A CMOS low-voltage, high-gain op-amp. 51-55 - Stéphane Donnay, Georges G. E. Gielen, Willy M. C. Sansen, Wim Kruiskamp, Domine Leenaerts, W. van Bokhoven:
High-level synthesis of analog sensor interface front-ends. 56-60
Advances in Built-In Self-Test
- Mehrdad Nourani, Christos A. Papachristou:
Structural BIST insertion using behavioral test analysis. 64-68 - Christian Dufaza, Yervant Zorian:
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs. 69-76 - Dimitrios Kagaris, Spyros Tragoudas:
Cellular automata for generating deterministic test sequences. 77-81
Synthesis of Controllers
- Andre Hertwig, Hans-Joachim Wunderlich:
Fast controllers for data dominated applications. 84-89 - Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada:
Random benchmark circuits with controlled attributes. 90-97 - Jordi Cortadella, Michael Kishinevsky, Alex Kondratyev, Luciano Lavagno, Alexandre Yakovlev:
Technology mapping of speed-independent circuits based on combinational decomposition and resynthesis. 98-105
Microsystems Design I
- Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois:
Generation of the HDL-A-model of a micromembrane from its finite-element-description. 108-112 - S. Wünsche, C. Clauss, Peter Schwarz, Frank Winkler:
Microsystem design using simulator coupling. 113-118 - B. Romanowicz, M. Laudon, P. Lerch, Philippe Renaud, Hans Peter Amann, A. Boegli, Vincent Moser, Fausto Pellandini:
Modeling and simulation of electromechanical transducers in microsystems using an analog hardware description language. 119-123
Software Generation for Embedded Processors
- M. L. G. Smeets, Emile H. L. Aarts, Gerben Essink, Erwin A. de Kock:
Delay management for programmable video signal processors. 126-133 - Yanbing Li, Wayne H. Wolf:
Hierarchical scheduling and allocation of multirate systems on heterogeneous multiprocessors. 134-139 - Rainer Leupers, Peter Marwedel:
Retargetable generation of code selectors from HDL processor models. 140-144
Register Transfer Level Test Synthesis
- Subhrajit Bhattacharya, Sujit Dey, Bhaskar Sengupta:
An RTL methodology to enable low overhead combinational testing. 146-152 - Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng:
A controller testability analysis and enhancement technique. 153-157 - Marie-Lise Flottes, R. Pires, Bruno Rouzeyre:
Analyzing testability from behavioral to RT level. 158-165
BDDs and Formal Verification
- Andreas Hett, Rolf Drechsler, Bernd Becker:
Fast and efficient construction of BDDs by reordering based synthesis. 168-175 - Gianpiero Cabodi, Paolo Camurati, Luciano Lavagno, Stefano Quer:
Verification and synthesis of counters based on symbolic techniques. 176-181 - Thomas Kropf, Jürgen Ruf:
Using MTBDDs for discrete timed symbolic model checking. 182-187
Microsystems Design II
- J. P. Fradin, L. Molla, B. Desaunettes:
Analysis of 3D conjugate heat transfers in electronics. 190-194 - Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff:
Smart sensor system application: an integrated compass. 195-199 - M. Lang, D. David, Manfred Glesner:
Automatic transfer of parametric FEM models into CAD-layout formats for top-down design of microsystems. 200-204
High Performance Architectures for Multimedia and Communication ASICs
- Radim Cmar, Serge Vernalde:
Highly scalable parallel parametrizable architecture of the motion estimator. 208-212 - Ander Royo, Javier Moran, Juan Carlos López:
Design and implementation of a coprocessor for cryptography applications. 213-217 - Jacobo Riesco, Juan Carlos Diaz, Luis A. Merayo, José Luis Conesa, Carlos Santos, Eduardo Juárez Martínez:
On the way to the 2.5 Gbits/s ATM network ATM multiplexer demultiplexer ASIC. 218-222
Decision Diagrams and Diagnosis
- Olivier Coudert:
Solving graph optimization problems with ZBDDs. 224-228 - Christoph Scholl, S. Melchior, Günter Hotz, Paul Molitor:
Minimizing ROBDD sizes of incompletely specified Boolean functionsby exploiting strong symmetries. 229-234 - Ayman M. Wahba, Dominique Borrione:
Connection error location and correction in combinational circuits. 235-241
Performance Modeling
- John P. Fishburn:
Shaping a VLSI wire to minimize Elmore delay. 244-251 - Sandip Kundu, Uttam Ghoshal:
Inductance analysis of on-chip interconnects [deep submicron CMOS]. 252-255 - U. Geigenmüller, N. P. van der Meijs:
Cartesian multipole based numerical integration for 3D capacitance extraction. 256-259
Progress in IDDQ Test Technology
- Viera Stopjaková, Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. 266-270 - Manoj Sachdev:
Deep sub-micron IDDQ testing: issues and solutions. 271-278 - B. Laquai, H. Richter, H. Werkmann:
A production-oriented measurement method for fast and exhaustive Iddq tests. 279-286
Architecture Exploration
- Pradip K. Jha, Nikil D. Dutt:
Library mapping for memories. 288-292 - Miguel Miranda, M. Kaspar, Francky Catthoor, Hugo De Man:
Architectural exploration and optimization for counter based hardware address generation. 293-298 - Min Xu, Fadi J. Kurdahi:
RTL synthesis with physical and controller information. 299-303
Layout Design
- K. S. Seong, C. M. Kyung:
Two-way partitioning based on direction vector [layout design]. 306-310 - Le-Chin Eugene Liu, Carl Sechen:
Multi-layer chip-level global routing using an efficient graph-based Steiner tree heuristic. 311-318 - Hsiao-Ping Tseng, Carl Sechen:
A gridless multi-layer router for standard cell circuits using CTM cells. 319-326
Testability Solutions for Regular Structures
- Kanad Chakraborty, Pinaki Mazumder:
A programmable boundary scan technique for board-level, parallel functional duplex march testing of word-oriented multiport static RAMs. 330-334 - Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian:
Fault-secure shifter design: results and implementations. 335-341 - Chih-Tsun Huang, Cheng-Wen Wu:
High-speed C-testable systolic array design for Galois-field inversion. 342-346
Data Converter Test Issues
- Karim Arabi, Bozena Kaminska:
Efficient and accurate testing of analog-to-digital converters using oscillation-test method. 348-352 - R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien:
Built-in self-test methodology for A/D converters. 353-358 - Edward K. F. Lee:
Reconfigurable data converter as a building block for mixed-signal test. 359-363
Extensions and Acceleration of Discrete Event Simulation
- Peter A. Walker, Sumit Ghosh:
VHDL extensions for complex transmission line simulation. 368-372 - Minoru Shoji, Fumiyasu Hirose, Shintaro Shimogori, Satoshi Kowatari, Hiroshi Nagai:
Acceleration of behavioral simulation on simulation specific machines. 373-377 - Peter A. Walker, Sumit Ghosh:
Exploiting temporal independence in distributed preemptive circuit simulation. 378-382
Analog Design and Layout Tools
- Les T. Walczowski, D. Nalbantis, W. A. J. Waller, Keng-Hua Shi:
Analogue layout generation by World Wide Web server-based agents. 384-388 - Juan A. Prieto, Adoración Rueda, José M. Quintana, José Luis Huertas:
A performance-driven placement algorithm with simultaneous Place&Route optimization for analog ICs. 389-394 - Ignacio Garcia-Vargas, Mariano Galan, Francisco V. Fernández, Ángel Rodríguez-Vázquez:
An algorithm for numerical reference generation in symbolic analysis of large analog circuits. 395-399
Power Modeling and Estimation
- Alessandro Bogliolo, Luca Benini, Giovanni De Micheli:
Adaptive least mean square behavioral power modeling. 404-410 - Sergey Gavrilov, Alexey Glebov, Sergey G. Rusakov, David T. Blaauw, Larry G. Jones, Gopalakrishnan Vijayan:
Fast power loss calculation for digital static CMOS circuits. 411-415 - Vikram Saxena, Farid N. Najm, Ibrahim N. Hajj:
Monte-Carlo approach for power estimation in sequential circuits. 416-420
Formal Methods in Synthesis and Verification
- Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda:
Hybrid symbolic-explicit techniques for the graph coloring problem. 422-426 - Dirk Eisenbiegler, Ramayya Kumar, Christian Blumenröhr:
A constructive approach towards correctness of synthesis-application within retiming. 427-431 - Stefan Hendricx, Luc J. M. Claesen:
A symbolic core approach to the formal verification of integrated mixed-mode applications. 432-436
Concurrent Checking
- Cristiana Bolchini, Fabio Salice, Donatella Sciuto:
A novel methodology for designing TSC networks based on the parity bit code. 440-444 - Michele Favalli, Cecilia Metra:
Testing scheme for IC's clocks. 445-449 - Antonis M. Paschalis, Nikolaos Gaitanis, Dimitris Gizopoulos, Panagiotis Kostarakis:
A totally self-checking 1-out-of-3 code error indicator. 450-454
New Ideas in Scheduling
- Sriram Govindarajan, Ranga Vemuri:
Cone-based clustering heuristic for list-scheduling algorithms. 456-462 - Dirk Herrmann, Rolf Ernst:
Register synthesis for speculative computation. 463-467 - Wim F. J. Verhaegh, Paul E. R. Lippens, Emile H. L. Aarts, Jef L. van Meerbergen:
Multidimensional periodic scheduling: a solution approach. 468-474
System Level Design Representation and Transformation
- Filip Thoen, J. Van Der Steen, Gjalt G. de Jong, Gert Goossens, Hugo De Man:
Multi-thread graph: a system model for real-time embedded software synthesis. 476-481 - Thorsten Grötker, Rainer Schoenen, Heinrich Meyr:
PCC: a modeling technique for mixed control/data flow systems. 482-486 - Frank Vahid:
Procedure cloning: a transformation for improved system-level functional partitioning. 487-492
Diagnosis and Test Generation
- Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat:
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor. 494-500 - José T. de Sousa, Peter Y. K. Cheung:
Improved diagnosis of realistic interconnect shorts. 501-505 - Irith Pomeranz, Sudhakar M. Reddy:
On improving genetic optimization based test generation. 506-511
Logic Synthesis for Low Power
- Luca Benini, Giovanni De Micheli, Enrico Macii, Massimo Poncino, Riccardo Scarsi:
Symbolic synthesis of clock-gating logic for power optimization of control-oriented synchronous networks. 514-520 - Prasoon Surti, Liang-Fang Chao, Akhilesh Tyagi:
Low power FSM design using Huffman-style encoding. 521-525 - Hoon Choi, Seung Ho Hwang:
Improving the accuracy of support-set finding method for power estimation of combinational circuits. 526-530
System Design Methodologies
- Ian Gibson, Chris Amies:
Practical concurrent ASIC and system design and verification. 532-536 - Claus Schneider:
A methodology for hardware architecture trade-off at different levels of abstraction. 537-541 - Patrick Schaumont, Serge Vernalde, Luc Rijnders, Marc Engels, Ivo Bolsens:
Synthesis of multi-rate and variable rate circuits for high speed telecommunications applications. 542-546
Testability at Different Abstraction Levels
- Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker:
Testability of 2-level AND/EXOR circuits. 548-553 - Irith Pomeranz, Sudhakar M. Reddy:
On the use of reset to increase the testability of interconnected finite-state machines. 554-559 - Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda, Raimund Ubar:
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs. 560-565
Hardware and Software Tools for Analog and Mixed-Signal Test
- Michel Renovell, Florence Azaïs, Yves Bertrand:
On-chip analog output response compaction. 568-572 - Thomas Olbrich, Ian Andrew Grout, Y. Eben Aimine, Andrew Mark David Richardson, Jean-Noël Contensou:
A new quality estimation methodology for mixed-signal and analogue ICs. 573-580 - V. Kaal, Hans G. Kerkhoff:
Compact structural test generation for analog macros. 581-587
Power Estimation and Modeling
- Jim E. Crenshaw, Majid Sarrafzadeh:
Accurate high level datapath power estimation. 590-596 - Salvador Manich, Joan Figueras:
Maximizing the weighted switching activity in combinational CMOS circuits under the variable delay model. 597-602 - S. Turgis, Jean Michel Daga, Josep M. Portal, Daniel Auvergne:
Internal power modelling and minimization in CMOS inverters. 603-608
Posters
- Julio Faura, C. Horton, B. Krah, Joan Cabestany, M. A. Aguirre, Josep Maria Insenser:
A new field programmable system-on-a-chip for mixed signal integration. 610 - Jeroen A. J. Leijten, Jef L. van Meerbergen, Adwin H. Timmer, Jochen A. G. Jess:
PROPHID: a data-driven multi-processor architecture for high-performance DSP. 611 - Clifford Liem, Pierre G. Paulin, Ahmed Amine Jerraya:
ReCode: the design and re-design of the instruction codes for embedded instruction-set processors. 612 - Thomas Röwekamp, Liliane Peters:
A real-time smart sensor system for visual motion estimation. 613 - J. Gonzalez-Torres, P. A. Mateos, J. M. Hernandez:
Full custom chip set for high speed serial communications up to 2.48 Gbit/s. 614 - M. R. Karthikeyan, Soumitra Kumar Nandy:
An asynchronous architecture for digital signal processors. 615 - Hassan Ihs, Christian Dufaza:
Test synthesis for DC test of switched-capacitors circuits. 616 - Vladimír Székely, Andras Pahi, András Poppe, Márta Rencz, Alpar Csendes:
SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. 617 - Marina Santo Zarnik, Franc Novak, Srecko Macek:
Design of oscillation-based test structures for active RC filters. 618 - Renate Beckmann, Jürgen Herrmann:
Using constraint logic programming in memory synthesis for general purpose computers. 619 - Igor Ozimek, R. Verlic, Jurij F. Tasic:
Optimal scheduling for fast systolic array implementations. 620 - Anne Mignotte, Olivier Peyran:
Scheduling using mixed arithmetic: an ILP formulation. 621 - Jeffrey Walrath, Ranga Vemuri, W. Bradley:
Performance verification using partial evaluation and interval analysis. 622 - Anatol Ursu, Gabriela Gruita, Sergiu Zaporojan:
Design and verification of the sequential systems automata using temporal logic specifications. 623 - Markus Wolf, Ulrich Kleine:
Application independent module generation in analog layouts. 624 - Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar:
A scheme for multiple on-chip signature checking for embedded SRAMs. 625 - Yoshinobu Higami, Kozo Kinoshita:
Design of partially parallel scan chain. 626 - Ad J. van de Goor, Georgi Gaydadjiev, Vyacheslav N. Yarmolik, V. G. Mikitjuk:
March LA: a test for linked memory faults. 627 - Ronald D. Blanton, John P. Hayes:
The input pattern fault model and its application. 628 - M. Svajda, B. Straka, Hans A. R. Manhaeve:
A monolithic off-chip IDDQ monitor. 629 - Adam Kristof:
Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections. 630
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