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2000 – 2009
- 2004
[c7]Marc E. Levitt:
Design for Manufacturing? Design for Yield!!! ISQED 2004: 19
1990 – 1999
- 1997
- [j4]Marc E. Levitt:
Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design. IEEE Des. Test Comput. 14(1): 8-9 (1997) - [j3]Marc E. Levitt:
Designing UltraSparc for Testability. IEEE Des. Test Comput. 14(1): 10-17 (1997) - [c6]Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat:
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor. ED&TC 1997: 494-500 - 1996
- [c5]Marc E. Levitt:
Formal Verification of the UltraSPARCTM Family of Processors via ATPG Methods. ITC 1996: 849-856 - 1995
- [j2]Lavi Lev, Andy Charnas, Marc Tremblay, Alexander Dalal, Bruce A. Frederick, Chakra R. Srivatsa, David Greenhill, Dennis L. Wendell, Duy Dinh Pham, Eric Anderson, Hemraj K. Hingarh, Inayat Razzack, James M. Kaku, Ken Shin, Marc E. Levitt, Michael Allen, Philip A. Ferolito, Richard L. Bartolotti, Robert K. Yu, Ronald J. Melanson, Shailesh I. Shah, Sophie Nguyen, Sundari S. Mitra, Vinita Reddy, Vidyasagar Ganesan, Willem J. de Lange:
A 64-b microprocessor with multimedia support. IEEE J. Solid State Circuits 30(11): 1227-1238 (1995) - [c4]Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam:
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor. ITC 1995: 157-166 - 1994
- [j1]Marc E. Levitt, Kaushik Roy, Jacob A. Abraham:
BiCMOS logic testing. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 241-248 (1994) - [c3]Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther:
Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294 - 1990
- [b1]Marc E. Levitt:
Time-based strategies for semiconductor manufacture and test. University of Illinois Urbana-Champaign, USA, 1990 - [c2]Marc E. Levitt, Kaushik Roy, Jacob A. Abraham:
BiCMOS fault models: is stuck-at adequate? ICCD 1990: 294-297
1980 – 1989
- 1989
- [c1]Marc E. Levitt, Jacob A. Abraham:
The Economics of Scan Design. ITC 1989: 869-874
Coauthor Index
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