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2000 – 2009
- 2005
[c143]Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng:
Hardware Ef.cient LBISTWith Complementary Weights. ICCD 2005: 479-484- 2004
- [j40]Dong Xiang, Janak H. Patel:
Partial Scan Design Based on Circuit State Information and Functional Analysis. IEEE Trans. Computers 53(3): 276-287 (2004) - [c142]Ravishankar K. Iyer, William H. Sanders, Janak H. Patel, Zbigniew Kalbarczyk:
The evolution of dependable computing at the University of Illinois. IFIP Congress Topical Sessions 2004: 135-164 - [c141]Mihir A. Shah, Janak H. Patel:
Enhancement of the Illinois Scan Architecture for Use with Multiple Scan Inputs. ISVLSI 2004: 167-172 - [c140]Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng:
Logic BIST with Scan Chain Segmentation. ITC 2004: 57-66 - [c139]Manish Sharma, Janak H. Patel:
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? VTS 2004: 31-36 - [c138]Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel:
Logic BIST Using Constrained Scan Cells. VTS 2004: 199-205 - 2003
- [c137]Manish Sharma, Janak H. Patel, Jeff Rearick:
Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture. VTS 2003: 15-21 - [c136]Janak H. Patel, Steven S. Lumetta, Sudhakar M. Reddy:
Application of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns. VTS 2003: 107-112 - 2002
- [c135]Amit R. Pandey, Janak H. Patel:
An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs. DATE 2002: 368-375 - [c134]Manish Sharma, Janak H. Patel:
Finding a Small Set of Longest Testable Paths that Cover Every Gate. ITC 2002: 974-982 - [c133]Amit R. Pandey, Janak H. Patel:
Reconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs . VTS 2002: 9-15 - 2001
- [j39]Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty:
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ACM Trans. Design Autom. Electr. Syst. 6(4): 471-489 (2001) - [c132]Frank F. Hsu, Kenneth M. Butler, Janak H. Patel:
A case study on the implementation of the Illinois Scan Architecture. ITC 2001: 538-547 - [c131]Manish Sharma, Janak H. Patel:
Testing of critical paths for delay faults. ITC 2001: 634-641 - [c130]Jian-Kun Zhao, Jeffrey A. Newquist, Janak H. Patel:
A Graph Traversal Based Framework For Sequential Logic Implication With An Application To C-Cycle Redundancy Identification. VLSI Design 2001: 163- - 2000
- [j38]Ilker Hamzaoglu, Janak H. Patel:
Test set compaction algorithms for combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(8): 957-963 (2000) - [j37]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst. 5(3): 548-565 (2000) - [j36]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Peak power estimation of VLSI circuits: new peak power measures. IEEE Trans. Very Large Scale Integr. Syst. 8(4): 435-439 (2000) - [c129]Ilker Hamzaoglu, Janak H. Patel:
Deterministic Test Pattern Generation Techniques for Sequential Circuits. ICCAD 2000: 538-543 - [c128]Manish Sharma, Janak H. Patel:
Enhanced delay defect coverage with path-segments. ITC 2000: 385-392 - [c127]Manish Sharma, Janak H. Patel:
Bounding Circuit Delay by Testing a Very Small Subset of Paths. VTS 2000: 333-342 - [c126]Ilker Hamzaoglu, Janak H. Patel:
Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. VTS 2000: 369-376
1990 – 1999
- 1999
- [j35]Ilker Hamzaoglu, Janak H. Patel:
New Techniques for Deterministic Test Pattern Generation. J. Electron. Test. 15(1-2): 63-73 (1999) - [j34]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Fast Static Compaction Algorithms for Sequential Circuit Test Vectors. IEEE Trans. Computers 48(3): 311-322 (1999) - [j33]Elizabeth M. Rudnick, Janak H. Patel:
Efficient Techniques for Dynamic Test Sequence Compaction. IEEE Trans. Computers 48(3): 323-330 (1999) - [c125]Ilker Hamzaoglu, Janak H. Patel:
Reducing Test Application Time for Full Scan Embedded Cores. FTCS 1999: 260-267 - [c124]Zbigniew Kalbarczyk, Janak H. Patel, Myeong S. Lee, Ravishankar K. Iyer:
An Approach to Evaluating the Effects of Realistic Faults in Digital Circuits. VLSI Design 1999: 260-265 - [c123]Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal:
A Test Generator for Segment Delay Faults. VLSI Design 1999: 484-491 - 1998
- [j32]Frank F. Hsu, Janak H. Patel:
High-Level Controllability and Observability Analysis for Test Synthesis. J. Electron. Test. 13(2): 93-103 (1998) - [j31]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(3): 239-254 (1998) - [c122]Frank F. Hsu, Janak H. Patel:
High-level variable selection for partial-scan implementation. ICCAD 1998: 79-84 - [c121]Ilker Hamzaoglu, Janak H. Patel:
Test set compaction algorithms for combinational circuits. ICCAD 1998: 283-289 - [c120]Fulvio Corno, Janak H. Patel, Elizabeth M. Rudnick, Matteo Sonza Reorda
, Roberto Vietti:
Enhancing topological ATPG with high-level information and symbolic techniques. ICCD 1998: 504-509 - [c119]Janak H. Patel:
Retrospective: Improving the Throughput of a Pipeline by Insertion of Delays. 25 Years ISCA: Retrospectives and Reprints 1998: 5 - [c118]Janak H. Patel:
Retrospective: A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. 25 Years ISCA: Retrospectives and Reprints 1998: 39-41 - [c117]Janak H. Patel, Edward S. Davidson:
Improving the Throughput of a Pipeline by Insertion of Delays. 25 Years ISCA: Retrospectives and Reprints 1998: 132-137 - [c116]Mark S. Papamarcos, Janak H. Patel:
A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. 25 Years ISCA: Retrospectives and Reprints 1998: 284-290 - [c115]Ilker Hamzaoglu, Janak H. Patel:
Compact two-pattern test set generation for combinational and full scan circuits. ITC 1998: 944-953 - [c114]Janak H. Patel:
Stuck-at fault: a fault model for the next millennium. ITC 1998: 1166 - [c113]Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel:
Partial Scan Selection Based on Dynamic Reachability and Observability Information. VLSI Design 1998: 174-180 - [c112]Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel:
Diagnostic Simulation of Sequential Circuits Using Fault Sampling. VLSI Design 1998: 476-481 - [c111]Ilker Hamzaoglu, Janak H. Patel:
New Techniques for Deterministic Test Pattern Generation. VTS 1998: 446-452 - 1997
- [j30]Frank F. Hsu, Janak H. Patel:
Design for Testability Using State Distances. J. Electron. Test. 11(1): 93-100 (1997) - [j29]Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell, Janak H. Patel:
Improving a nonenumerative method to estimate path delay fault coverage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(7): 759-762 (1997) - [j28]Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann:
A genetic algorithm framework for test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(9): 1034-1044 (1997) - [j27]Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel:
Algorithms to compute bridging fault coverage of IDDQ test sets. ACM Trans. Design Autom. Electr. Syst. 2(3): 281-305 (1997) - [c110]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Sequential circuit test generation using dynamic state traversal. ED&TC 1997: 22-28 - [c109]Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel:
Partial Scan beyond Cycle Cutting. FTCS 1997: 320-328 - [c108]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Effects of delay models on peak power estimation of VLSI sequential circuits. ICCAD 1997: 45-51 - [c107]Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal:
Fast identification of untestable delay faults using implications. ICCAD 1997: 642-647 - [c106]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
K2: an estimator for peak sustainable power of VLSI circuits. ISLPED 1997: 178-183 - [c105]Elizabeth M. Rudnick, Janak H. Patel:
Putting the Squeeze on Test Sequences. ITC 1997: 723-732 - [c104]James P. Cusey, Janak H. Patel:
BART: A Bridging Fault Test Generation for Sequential Circuits. ITC 1997: 838-847 - [c103]Dilip Krishnaswamy, Prithviraj Banerjee, Elizabeth M. Rudnick, Janak H. Patel:
Asynchronous Parallel Algorithms for Test Set Partitioned Fault Simulation. Workshop on Parallel and Distributed Simulation 1997: 30-37 - [c102]Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee:
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation. VLSI Design 1997: 475-481 - [c101]Elizabeth M. Rudnick, Janak H. Patel:
Overcoming the Serial Logic Simulation Bottleneck in Parallel Fault Simulation. VLSI Design 1997: 495-503 - [c100]Charles R. Graham, Elizabeth M. Rudnick, Janak H. Patel:
Dynamic Fault Grouping for PROOFS: A Win for Large Sequential Circuits. VLSI Design 1997: 542-544 - [c99]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. VTS 1997: 188-195 - [c98]Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs:
Diagnostic Test Pattern Generation for Sequential Circuits. VTS 1997: 196-202 - [c97]Dilip Krishnaswamy, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee:
SPITFIRE: scalable parallel algorithms for test set partitioned fault simulation. VTS 1997: 274-281 - [c96]Jian-Kun Zhao, Elizabeth M. Rudnick, Janak H. Patel:
Static logic implication with application to redundancy identification. VTS 1997: 288-295 - 1996
- [j26]Hungse Cha, Elizabeth M. Rudnick, Janak H. Patel, Ravishankar K. Iyer, Gwan S. Choi:
A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults. IEEE Trans. Computers 45(11): 1248-1256 (1996) - [j25]Jaushin Lee, Janak H. Patel:
Hierarchical test generation under architectural level functional constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(9): 1144-1151 (1996) - [c95]Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel:
Partial Scan Design Based on Circuit State Information. DAC 1996: 807-812 - [c94]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Alternating Strategies for Sequential Circuit ATPG. ED&TC 1996: 368-374 - [c93]Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel:
On Double Transition Faults as a Delay Fault Model. Great Lakes Symposium on VLSI 1996: 282-287 - [c92]Elizabeth M. Rudnick, Janak H. Patel:
Simulation-based techniques for dynamic test sequence compaction. ICCAD 1996: 67-73 - [c91]Frank F. Hsu, Elizabeth M. Rudnick, Janak H. Patel:
Enhancing high-level control-flow for improved testability. ICCAD 1996: 322-328 - [c90]Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal:
SIGMA: a simulator for segment delay faults. ICCAD 1996: 502-508 - [c89]Frank F. Hsu, Elizabeth M. Rudnick, Janak H. Patel:
Testability Insertion in Behavioral Descriptions. ISSS 1996: 139-144 - [c88]Elizabeth M. Rudnick, Janak H. Patel, Irith Pomeranz:
On Potential Fault Detection in Sequential Circuits. ITC 1996: 142-149 - [c87]Dong Xiang, Janak H. Patel:
A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. ITC 1996: 548-557 - [c86]Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal:
Improving accuracy in path delay fault coverage estimation. VLSI Design 1996: 422-425 - [c85]Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal:
Segment delay faults: a new fault model. VTS 1996: 32-41 - [c84]Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Automatic test generation using genetically-engineered distinguishing sequences. VTS 1996: 216-223 - [c83]Terry Lee, Ibrahim N. Hajj, Elizabeth M. Rudnick, Janak H. Patel:
Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits. VTS 1996: 456-462 - 1995
- [j24]Elizabeth M. Rudnick, Vivek Chickermane, Prithviraj Banerjee, Janak H. Patel:
Sequential circuit testability enhancement using a nonscan approach. IEEE Trans. Very Large Scale Integr. Syst. 3(2): 333-338 (1995) - [c82]Eiji Harada, Janak H. Patel:
Overhead reduction techniques for hierarchical fault simulation. Asian Test Symposium 1995: 79-85 - [c81]Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel:
Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. DAC 1995: 133-138 - [c80]Elizabeth M. Rudnick, Janak H. Patel:
Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation. DAC 1995: 183-188 - [c79]Paul J. Thadikaran, Sreejit Chakravarty, Janak H. Patel:
Fault Simulation ofIDDQ Tests for Bridging Faults in Sequential Circuits. FTCS 1995: 340-349 - [c78]Steven Parkes, Prithviraj Banerjee, Janak H. Patel:
A parallel algorithm for fault simulation based on PROOFS . ICCD 1995: 616-621 - [c77]Michael S. Hsiao, Janak H. Patel:
A new architectural-level fault simulation using propagation prediction of grouped fault-effects. ICCD 1995: 628-635 - [c76]Elizabeth M. Rudnick, Janak H. Patel:
A genetic approach to test application time reduction for full scan and partial scan circuits. VLSI Design 1995: 288-293 - [c75]Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel:
Cyclic stress tests for full scan circuits. VTS 1995: 89-94 - [c74]Frank F. Hsu, Janak H. Patel:
A distance reduction approach to design for testability. VTS 1995: 158-163 - 1994
- [j23]Vivek Chickermane, Jaushin Lee, Janak H. Patel:
Addressing design for testability at the architectural level. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(7): 920-934 (1994) - [j22]Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel:
An observability enhancement approach for improved testability and at-speed test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(8): 1051-1056 (1994) - [j21]Jaushin Lee, Janak H. Patel:
Architectural level test generation for microprocessors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(10): 1288-1300 (1994) - [c73]Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther:
Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294 - [c72]Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann:
Sequential Circuit Test Generation in a Genetic Algorithm Framework. DAC 1994: 698-704 - [c71]Steven Parkes, Prithviraj Banerjee, Janak H. Patel:
ProperHITEC: A Portable, Parallel, Object-Oriented Approach to Sequential Test Generation. DAC 1994: 717-721 - [c70]Elizabeth M. Rudnick, John G. Holm, Daniel G. Saab, Janak H. Patel:
Application of Simple Genetic Algorithms to Sequential Circuit Test Generation. EDAC-ETC-EUROASIC 1994: 40-45 - [c69]John W. C. Fu, Janak H. Patel:
Trace Driven Simulation using Sampled Traces. HICSS (1) 1994: 211-220 - [c68]Abhijit Dharchoudhury, Sung-Mo Kang, Hungse Cha, Janak H. Patel:
Fast timing simulation of transient faults in digital circuits. ICCAD 1994: 719-722 - [c67]Hungse Cha, Janak H. Patel:
Latch Design for Transient Pulse Tolerance. ICCD 1994: 385-388 - [c66]Jeff Baxter, John W. C. Fu, Balkrishna Ramkumar, Janak H. Patel:
Hybrid Resource Management Algorithms for Multicomputer Systems. IPPS 1994: 482-489 - 1993
- [j20]Jaushin Lee, Janak H. Patel:
An architectural level test generator based on nonlinear equation solving. J. Electron. Test. 4(2): 137-150 (1993) - [j19]Alok N. Choudhary, Janak H. Patel, Narendra Ahuja:
NETRA: A Hierarchical and Partitionable Architecture for Computer Vision Systems. IEEE Trans. Parallel Distributed Syst. 4(10): 1092-1104 (1993) - [c65]Vivek Chickermane, Elizabeth M. Rudnick, Prithviraj Banerjee, Janak H. Patel:
Non-Scan Design-for-Testability Techniques for Sequential Circuits. DAC 1993: 236-241 - [c64]Hungse Cha, Elizabeth M. Rudnick, Gwan S. Choi, Janak H. Patel, Ravishankar K. Iyer:
A Fast and Accurate Gate-Level Transient Fault Simulation Environment. FTCS 1993: 310-319 - [c63]Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel:
Theory and Practice of Sequential Machine Testing and Testability. FTCS 1993: 330-337 - [c62]Hungse Cha, Janak H. Patel:
A Logic-Level Model for alpha-Paricle Hits in CMOS Circuits. ICCD 1993: 538-542 - [c61]John W. C. Fu, Janak H. Patel:
Memory Reference Behavior of Compiler Optimized Programs on High Speed. ICPP (2) 1993: 87-94 - [c60]Pi-Yu Chung, Ibrahim N. Hajj, Janak H. Patel:
Efficient Variable Ordering Heuristics for Shared ROBDD. ISCAS 1993: 1690-1693 - [c59]Jeff Rearick, Janak H. Patel:
Fast and Accurate CMOS Bridging Fault Simulation. ITC 1993: 54-62 - [c58]Jaushin Lee, Janak H. Patel:
Testability analysis based on structural and behavioral information. VTS 1993: 139-146 - [c57]Jaushin Lee, Vivek Chickermane, Janak H. Patel:
Impact of high level functional constraints on testability. VTS 1993: 309-312 - 1992
- [j18]Pinaki Mazumder, Janak H. Patel:
An efficient design of embedded memories and their testability analysis using Markov chains. J. Electron. Test. 3(3): 235-250 (1992) - [j17]Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel:
PROOFS: a fast, memory-efficient sequential circuit fault simulator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2): 198-207 (1992) - [j16]Thomas M. Niermann, Rabindra K. Roy, Janak H. Patel, Jacob A. Abraham:
Test compaction for sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2): 260-267 (1992) - [c56]Sungho Kim, Prithviraj Banerjee, Vivek Chickermane, Janak H. Patel:
APT: An Area-Performance-Testability Driven Placement Algorithm. DAC 1992: 141-146 - [c55]Jaushin Lee, Janak H. Patel:
Hierarchical Test Generation under Intensive Global Functional Constraints. DAC 1992: 261-266 - [c54]Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu:
Automatic test generation for linear digital systems with bi-level search using matrix transform methods. ICCAD 1992: 224-228 - [c53]Gary S. Greenstein, Janak H. Patel:
E-PROOFS: a CMOS bridging fault simulator. ICCAD 1992: 268-271 - [c52]Vivek Chickermane, Jaushin Lee, Janak H. Patel:
A comparative study of design for testability methods using high-level and gate-level descriptions. ICCAD 1992: 620-624 - [c51]Jeff Baxter, Balkrishna Ramkumar, Janak H. Patel:
Compile Time Parallel Resource Allocation for Unbounded Tree Structure Task Graphs. ICPP (1) 1992: 202-209 - [c50]Jeff Baxter, Janak H. Patel:
Profiling Based Task Migration. IPPS 1992: 192-195 - [c49]Jaushin Lee, Janak H. Patel:
An Instruction Sequence Assembling Methodology for Testing Microprocessors. ITC 1992: 49-58 - [c48]Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel:
Diagnostic Fault Simulation of Sequential Circuits. ITC 1992: 178-186 - [c47]Vivek Chickermane, Jaushin Lee, Janak H. Patel:
Design for Testability Using Architectural Descriptions. ITC 1992: 752-761 - [c46]John W. C. Fu, Janak H. Patel, Bob L. Janssens:
Stride directed prefetching in scalar processors. MICRO 1992: 102-110 - [c45]Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel:
Probe point insertion for at-speed test. VTS 1992: 223-228 - 1991
- [j15]Abhijit Chatterjee, Rabindra K. Roy, Jacob A. Abraham, Janak H. Patel:
Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors. Digit. Signal Process. 1(4): 231-244 (1991) - [c44]Srinivas Patil, Prithviraj Banerjee, Janak H. Patel:
Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors. DAC 1991: 155-159 - [c43]Thomas M. Niermann, Janak H. Patel:
HITEC: a test generation package for sequential circuits. EURO-DAC 1991: 214-218 - [c42]Jaushin Lee, Janak H. Patel:
An Architectural Level Test Generator for a Hierarchical Design Environment. FTCS 1991: 44-51 - [c41]Vivek Chickermane, Janak H. Patel:
A Fault Oriented Partial Scan Design Approach. ICCAD 1991: 400-403 - [c40]Jaushin Lee, Janak H. Patel:
A Signal-Driven Discrete Relaxation Technique for Architectural Level Test Generation. ICCAD 1991: 458-461 - [c39]Elizabeth M. Rudnick, Thomas M. Niermann, Janak H. Patel:
Methods for Reducing Events in Sequential Circuit Fault Simulation. ICCAD 1991: 546-549 - [c38]John W. C. Fu, Janak H. Patel:
Data Prefetching Strategies for Vector Cache Memories. IPPS 1991: 555-560 - [c37]Alfred Brenner, Richard F. Freund, R. Stockton Gaines, Rob Kelly, Louis Lome, Richard McAndrew, Alexandru Nicolau, Janak H. Patel, Thomas Probert, John H. Reif, Jorge L. C. Sanz, Howard Jay Siegel, Jon A. Webb:
How Do We Make Parallel Processing a Reality? Bridging the Gap Between Theory and Practice. IPPS 1991: 648-653 - [c36]John W. C. Fu, Janak H. Patel:
Data Prefetching in Multiprocessor Vector Cache Memories. ISCA 1991: 54-63 - [c35]Jaushin Lee, Janak H. Patel:
ARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults. ITC 1991: 729-738 - 1990
- [j14]Kun-Lung Wu, W. Kent Fuchs, Janak H. Patel:
Error Recovery in Shared Memory Multiprocessors Using Private Caches. IEEE Trans. Parallel Distributed Syst. 1(2): 231-240 (1990) - [c34]Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel:
Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator. DAC 1990: 535-540 - [c33]Wu-Tung Cheng, Janak H. Patel:
PROOFS: a super fast fault simulator for sequential circuits. EURO-DAC 1990: 475-479 - [c32]Alok N. Choudhary, Janak H. Patel:
Performance Evaluation of Clusters of NETRA: An Architecture for Computer Vision Systems. ICPP (1) 1990: 494-497 - [c31]Alok N. Choudhary, Mun K. Leung, Thomas S. Huang, Janak H. Patel:
Parallel implementation and evaluation of motion estimation system algorithms on a distributed memory multiprocessor using knowledge based mappings. ICPR (2) 1990: 337-342 - [c30]Alok N. Choudhary, Subhodev Das, Narendra Ahuja, Janak H. Patel:
A reconfigurable and hierarchical parallel processing architecture: performance results for stereo vision. ICPR (2) 1990: 389-393 - [c29]Vivek Chickermane, Janak H. Patel:
An optimization based approach to the partial scan design problem. ITC 1990: 377-386
1980 – 1989
- 1989
- [j13]Pinaki Mazumder, Janak H. Patel:
Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 38(3): 394-407 (1989) - [j12]Ming-Feng Chang, W. Kent Fuchs, Janak H. Patel:
Diagnosis and Repair of Memory with Coupling Faults. IEEE Trans. Computers 38(4): 493-500 (1989) - [j11]Susheel J. Chandra, Janak H. Patel:
Experimental evaluation of testability measures for test generation (logic circuits). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(1): 93-97 (1989) - [c28]Utpal J. Davé, Janak H. Patel:
A Functional-Level Test Generation Methodology Using Two-level Representations. DAC 1989: 722-725 - [c27]Susheel J. Chandra, Janak H. Patel:
Accurate logic simulation in the presence of unknowns. ICCAD 1989: 34-37 - [c26]Kun-Lung Wu, W. Kent Fuchs, Janak H. Patel:
Cache-Based Error Recovery for Shared Memory Multiprocessor Systems. ICPP (1) 1989: 159-166 - [c25]Jeff Baxter, Janak H. Patel:
The LAST Algorithm: A Heuristic-Based Static Task Allocation Algorithm. ICPP (2) 1989: 217-222 - [c24]Alok N. Choudhary, Janak H. Patel:
Load balancing and task decomposition techniques for parallel implementation of integrated vision systems algorithms. SC 1989: 266-275 - 1988
- [j10]Subhasis Laha, Janak H. Patel, Ravishankar K. Iyer:
Accurate Low-Cost Methods for Performance Evaluation of Cache Memory Systems. IEEE Trans. Computers 37(11): 1325-1336 (1988) - [j9]Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs:
Methodologies for testing embedded content addressable memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1): 11-20 (1988) - [c23]Rabindra K. Roy, Thomas M. Niermann, Janak H. Patel, Jacob A. Abraham, Resve A. Saleh:
Compaction of ATPG-generated test sequences for sequential circuits. ICCAD 1988: 382-385 - [c22]Ming-Feng Chang, W. Kent Fuchs, Janak H. Patel:
Diagnosis and repair of memory with coupling faults. ICCAD 1988: 524-527 - [c21]Susheel J. Chandra, Janak H. Patel:
Test generation in a parallel processing environment. ICCD 1988: 11-14 - [c20]Alok N. Choudhary, Janak H. Patel:
A Parallel Processing Architecture for an Integrated Vision System. ICPP (1) 1988: 383-387 - [c19]Richard J. Eickemeyer, Janak H. Patel:
Performance Evaluation of On-Chip Register and Cache Organizations. ISCA 1988: 64-72 - 1987
- [j8]Wu-Tung Cheng, Janak H. Patel:
A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders. IEEE Trans. Computers 36(7): 891-895 (1987) - [c18]Susheel J. Chandra, Janak H. Patel:
A Hierarchical Approach Test Vector Generation. DAC 1987: 495-501 - [c17]Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs:
Design and Algorithms for Parallel Testing of Random Access and Content Addressable Memories. DAC 1987: 689-694 - [c16]Santosh G. Abraham, Janak H. Patel:
Parallel Garbage Collection on a Virtual Memory System. ICPP 1987: 243-246 - [c15]Richard J. Eickemeyer, Janak H. Patel:
Performance Evaluation of Multiple Register Sets. ISCA 1987: 264-271 - 1986
- [c14]Sanjay J. Patel, Janak H. Patel:
Effectiveness of heuristics measures for automatic test pattern generation. DAC 1986: 547-552 - [c13]Mohammad Malkawi, Janak H. Patel:
Performance Measurement of Paging Behavior in Multiprogramming Systems. ISCA 1986: 111-118 - 1985
- [c12]Ashwin Ram, Janak H. Patel:
Parallel Garbage Collection Without Synchronization Overhead. ISCA 1985: 84-90 - [c11]Gurindar S. Sohi, Edward S. Davidson, Janak H. Patel:
An Efficient LISP-Execution Architecture with a New Representation for List Structures. ISCA 1985: 91-98 - [c10]Wu-Tung Cheng, Janak H. Patel:
Multiple-Fault Detection in Iterative Logic Arrays. ITC 1985: 493-499 - [c9]Mohammad Malkawi, Janak H. Patel:
Compiler Directed Memory Management Policy For Numerical Programs. SOSP 1985: 97-106 - 1984
- [c8]Mark S. Papamarcos, Janak H. Patel:
A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories. ISCA 1984: 348-354 - [c7]Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham:
Design of Test Pattern Generators for Built-In Test. ITC 1984: 315-319 - 1983
- [j7]Phil C. C. Yeh, Janak H. Patel, Edward S. Davidson:
Shared Cache for Multiple-Stream Computer Systems. IEEE Trans. Computers 32(1): 38-47 (1983) - [j6]Janak H. Patel, Leona Y. Fung:
Concurrent Error Detection in Multiply and Divide Arrays. IEEE Trans. Computers 32(4): 417-422 (1983) - [c6]Phil C. C. Yeh, Janak H. Patel, Edward S. Davidson:
Performance of Shared Cache for Parallel-Pipelined Computer Systems. ISCA 1983: 117-123 - 1982
- [j5]Janak H. Patel:
Analysis of Multiprocessors with Private Cache Memories. IEEE Trans. Computers 31(4): 296-304 (1982) - [j4]Janak H. Patel, Leona Y. Fung:
Concurrent Error Detection in ALU's by Recomputing with Shifted Operands. IEEE Trans. Computers 31(7): 589-595 (1982) - [j3]David W. L. Yen, Janak H. Patel, Edward S. Davidson:
Memory Interference in Synchronous Multiprocessor Systems. IEEE Trans. Computers 31(11): 1116-1121 (1982) - [c5]Gregory F. Grohoski, Janak H. Patel:
A performance model for instruction prefetch in pipelined instruction units. ICPP 1982: 248-252 - 1981
- [j2]Janak H. Patel:
Performance of Processor-Memory Interconnections for Multiprocessors. IEEE Trans. Computers 30(10): 771-780 (1981) - 1980
- [j1]Janak H. Patel:
An Alternative to the Distributed Pipeline. IEEE Trans. Computers 29(8): 736-737 (1980)
1970 – 1979
- 1979
- [c4]Janak H. Patel:
Processor-Memory Interconnections for Multiprocessors. ISCA 1979: 168-177 - [c3]Faye A. Briggs, King-Sun Fu, Kai Hwang, Janak H. Patel:
PM4 - A reconfigurable multiprocessor system for pattern recognition and image processing. MARK 1979: 255-266 - 1978
- [c2]Janak H. Patel:
Pipelines wth Internal Buffers. ISCA 1978: 249-255 - 1976
- [c1]Janak H. Patel, Edward S. Davidson:
Improving the Throughput of a Pipeline by Insertion of Delays. ISCA 1976: 159-164
Coauthor Index
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