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Susheel J. Chandra

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1990 – 1999

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1991
[c6]
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Susheel J. Chandra, Tom Ferry, Tushar Gheewala, Kerry Pierce:
ATPG Based on a Novel Grid-Addressable Latch Element. DAC 1991: 282-286
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Susheel J. Chandra, Tushar Gheewala, Hector R. Sucar, George Swan:
Use of CrossCheck test technology in practical applications. VTS 1991: 16-21

1980 – 1989

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1989
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Susheel J. Chandra:
Techniques to speedup test generation for VLSI circuits. University of Illinois Urbana-Champaign, USA, 1989
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Susheel J. Chandra, Janak H. Patel:
Experimental evaluation of testability measures for test generation (logic circuits). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(1): 93-97 (1989)
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Susheel J. Chandra, Janak H. Patel:
Accurate logic simulation in the presence of unknowns. ICCAD 1989: 34-37
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Hector R. Sucar, Susheel J. Chandra, David J. Wharton:
High performance test generation for accurate defect models in CMOS gate array technology. ICCAD 1989: 166-169
1988
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Susheel J. Chandra, Janak H. Patel:
Test generation in a parallel processing environment. ICCD 1988: 11-14
1987
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Susheel J. Chandra, Janak H. Patel:
A Hierarchical Approach Test Vector Generation. DAC 1987: 495-501

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