"Efficient testing strategies for bit- and digit-serial arrays used in ..."

Abhijit Chatterjee et al. (1991)

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DOI: 10.1016/1051-2004(91)90115-2

access: closed

type: Journal Article

metadata version: 2020-02-20

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Abhijit Chatterjee, Rabindra K. Roy, Jacob A. Abraham, Janak H. Patel:
Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors. Digit. Signal Process. 1(4): 231-244 (1991)

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