"Design of Test Pattern Generators for Built-In Test."

Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham (1984)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham:
Design of Test Pattern Generators for Built-In Test. ITC 1984: 315-319

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