"Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators."

Ilker Hamzaoglu, Janak H. Patel (2000)

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DOI: 10.1109/VTEST.2000.843867

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ilker Hamzaoglu, Janak H. Patel:
Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. VTS 2000: 369-376

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