"Sequential circuit testability enhancement using a nonscan approach."

Elizabeth M. Rudnick et al. (1995)

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DOI: 10.1109/92.386233

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/RudnickCBP95
Elizabeth M. Rudnick, Vivek Chickermane, Prithviraj Banerjee, Janak H. Patel:
Sequential circuit testability enhancement using a nonscan approach. IEEE Trans. Very Large Scale Integr. Syst. 3(2): 333-338 (1995)

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