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ORCIDKenneth M. Butler
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2010 – 2019
- 2017
[c44]Li Xu, Yuming Zhuang
, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen:
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC 2017: 1-10- 2016
- [c43]Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8 - [c42]David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar:
Statistical outlier screening as a test solution health monitor. ITC 2016: 1-10 - 2015
- [c41]Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler:
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE 2015: 1042-1047 - 2014
- [c40]Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler:
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC 2014: 1-10 - 2013
- [j13]Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi:
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29(6): 745-762 (2013) - [j12]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Efficient Process Shift Detection and Test Realignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12): 1934-1942 (2013) - [j11]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 21(6): 1116-1128 (2013) - [c39]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive quality binning for analog circuits. ETS 2013: 1-6 - [c38]Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy:
A design-for-reliability approach based on grading library cells for aging effects. ITC 2013: 1-7 - [c37]Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler:
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC 2013: 1-10 - 2012
- [c36]Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan:
Early prediction of NBTI effects using RTL source code analysis. DAC 2012: 808-813 - 2011
- [c35]Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler:
Test cost reduction through performance prediction using virtual probe. ITC 2011: 1-9 - [c34]Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10 - [c33]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC 2011: 1-8 - 2010
- [j10]Mohammad Tehranipoor, Kenneth M. Butler:
Power Supply Noise: A Survey on Effects and Research. IEEE Des. Test Comput. 27(2): 51-67 (2010) - [c32]Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli:
Adapting to adaptive testing. DATE 2010: 556-561 - [c31]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC 2010: 674-683
2000 – 2009
- 2009
- [j9]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009) - [c30]Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger:
Quality improvement and cost reduction using statistical outlier methods. ICCD 2009: 64-69 - 2008
- [c29]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena:
Modeling Test Escape Rate as a Function of Multiple Coverages. ITC 2008: 1-9 - 2007
- [j8]Mohammad Tehranipoor, Kenneth M. Butler:
Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Des. Test Comput. 24(3): 214-215 (2007) - [j7]Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler:
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 896-906 (2007) - 2006
- [j6]Kenneth M. Butler:
Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Des. Test Comput. 23(5): 388-389 (2006) - 2004
- [c28]Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington:
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364 - [c27]Kenneth M. Butler:
Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC 2004: 1419 - 2003
- [j5]Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang:
Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Des. Test Comput. 20(5): 6-7 (2003) - [c26]Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger:
A Case Study of IR-Drop in Structured At-Speed Testing. ITC 2003: 1098-1104 - 2002
- [c25]Hari Balachandran, Kenneth M. Butler, Neil Simpson:
Facilitating Rapid First Silicon Debug. ITC 2002: 628-637 - [c24]Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech:
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129 - [c23]Kenneth M. Butler:
Is ITC Bored with Board Test? ITC 2002: 1237 - 2001
- [j4]Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang:
Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. 18(1): 31-41 (2001) - [c22]Frank F. Hsu, Kenneth M. Butler, Janak H. Patel:
A case study on the implementation of the Illinois Scan Architecture. ITC 2001: 538-547 - [c21]Jayashree Saxena, Kenneth M. Butler, Lee Whetsel:
An analysis of power reduction techniques in scan testing. ITC 2001: 670-677 - 2000
- [c20]Jayashree Saxena, Kenneth M. Butler:
An empirical study on the effects of test type ordering on overall test efficiency. ITC 2000: 408-416 - [c19]Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler:
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738
1990 – 1999
- 1999
- [j3]Kenneth M. Butler:
Estimating the Economic Benefits of DFT. IEEE Des. Test Comput. 16(1): 71-79 (1999) - [c18]Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala:
Expediting ramp-to-volume production. ITC 1999: 103-112 - [c17]Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith:
Correlation of logical failures to a suspect process step. ITC 1999: 458-476 - [c16]Kenneth M. Butler:
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC 1999: 839-847 - [c15]Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer:
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274 - 1998
- [c14]Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess:
On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757 - [c13]Kenneth M. Butler:
The stuck-at fault: it ain't over 'til it's over. ITC 1998: 1165 - 1997
- [j2]Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena:
Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. 14(3): 83-89 (1997) - [c12]David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler:
Bridging Fault Diagnosis in the Absence of Physical Information. ITC 1997: 887-893 - [c11]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly:
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038 - [c10]Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459 - 1996
- [c9]Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena:
Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934 - 1995
- [c8]Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell:
Test Generation and Design for Test for a Large Multiprocessing DSP. ITC 1995: 149-156 - [c7]Kenneth M. Butler:
Deep Submicron: Is Test Up to the Challenge? ITC 1995: 923 - 1994
- [c6]Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry:
Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. VTS 1994: 192-196 - 1992
- [c5]Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross:
The roles of controllability and observability in design for test. VTS 1992: 211-216 - 1991
- [j1]Don E. Ross, Kenneth M. Butler, M. Ray Mercer:
Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electron. Test. 2(3): 243-259 (1991) - [c4]Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer:
Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420 - [c3]Don E. Ross, Kenneth M. Butler, Rohit Kapur, M. Ray Mercer:
Fast functional evaluation of candidate OBDD variable orderings. EURO-DAC 1991: 4-10 - 1990
- [c2]Kenneth M. Butler, M. Ray Mercer:
The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC 1990: 673-678
1980 – 1989
- 1988
- [c1]Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler:
CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC 1988: 597-600
Coauthor Index
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