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2020 – today
- 2024
[c46]Khaled Sidahmed Sidahmed Alamin, Davide Appello, Alessandro Beghi, Nicola Dall'Ora, Fabio Depaoli, Santa Di Cataldo, Franco Fummi, Sebastiano Gaiardelli, Michele Lora, Enrico Macii, Alessio Mascolini, Daniele Pagano, Francesco Ponzio, Gian Antonio Susto, Sara Vinco:
An AI-Enabled Framework for Smart Semiconductor Manufacturing. DATE 2024: 1-6- 2023
- [j10]Francesco Angione
, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11: 105655-105676 (2023) - [j9]Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72(5): 1447-1459 (2023) - [c45]Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre:
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS 2023: 21-26 - [c44]Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS 2023: 1-7 - [c43]Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre:
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS 2023: 1-6 - [c42]Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre:
A guided debugger-based fault injection methodology for assessing functional test programs. VTS 2023: 1-7 - 2022
- [j8]Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10: 56440-56457 (2022) - [c41]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT 2022: 1-6 - [c40]Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS 2022: 1-10 - [c39]Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS 2022: 1-6 - [c38]Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
A novel SEU injection setup for Automotive SoC. ISIE 2022: 623-626 - [c37]Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An innovative Strategy to Quickly Grade Functional Test Programs. ITC 2022: 355-364 - [c36]Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ITC 2022: 646-649 - [c35]Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS 2022: 1-6 - 2021
- [c34]Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli:
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS 2021: 69-74 - [c33]Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli:
Innovative methods for Burn-In related Stress Metrics Computation. DTIS 2021: 1-6 - [c32]Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda:
System-Level Test: State of the Art and Challenges. IOLTS 2021: 1-7 - 2020
- [c31]Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali:
Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS 2020: 1-6
2010 – 2019
- 2019
- [c30]F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi:
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS 2019: 1-6 - 2018
- [j7]Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35(3): 46-53 (2018) - [j6]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini:
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34(1): 43-52 (2018) - [j5]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14(1): 86-98 (2018) - 2017
- [c29]Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini:
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE 2017: 646-649 - [c28]Davide Appello, M. Laurino, Marco Pranzo:
A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. ITC-Asia 2017: 138-143 - [c27]Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello:
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS 2017: 1-6 - 2013
- [c26]Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman:
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS 2013: 1 - [c25]Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello:
Current testing: Dead or alive? ETS 2013: 1 - 2011
- [c24]Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi:
Optimized embedded memory diagnosis. DDECS 2011: 347-352 - 2010
- [c23]Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli:
Adapting to adaptive testing. DATE 2010: 556-561 - [c22]Davide Appello:
Safety features of SoCs: How can they be re-used? DDECS 2010: 2 - [c21]Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone:
Cumulative embedded memory failure bitmap display & analysis. DDECS 2010: 255-260 - [c20]Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda:
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34
2000 – 2009
- 2009
- [j4]Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda:
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. 17(11): 1654-1659 (2009) - [c19]Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda:
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS 2009: 93-98 - [c18]C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi:
An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS 2009: 15-20 - [c17]Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74 - [c16]Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 - 2008
- [c15]Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso:
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. ETS 2008: 140-145 - [c14]Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello:
Robust Design-for-Productization Practices for High Quality Automotive Products. ITC 2008: 1-9 - 2007
- [c13]Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda:
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300 - [c12]Davide Appello:
Automotive IC's: less testing, more prevention. ITC 2007: 1-2 - 2006
- [j3]Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. 23(3): 203-211 (2006) - [c11]Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
Embedded Memory Diagnosis: An Industrial Workflow. ITC 2006: 1-9 - [c10]Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171 - [c9]Davide Appello:
Session Abstract. VTS 2006: 240-241 - 2004
- [j2]Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew:
Understanding Yield Losses in Logic Circuits. IEEE Des. Test Comput. 21(3): 208-215 (2004) - [j1]Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. 20(1): 79-87 (2004) - [c8]Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre:
Yield Analysis of Logic Circuits. VTS 2004: 103-108 - 2003
- [c7]Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve:
A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field. ETW 2003: 65-70 - [c6]Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante:
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385 - 2002
- [c5]Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210 - [c4]Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello:
High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039 - [c3]Davide Appello:
The Yield of Test Outsourcing. ITC 2002: 1215 - [c2]Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16 - 2001
- [c1]Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium 2001: 97-102
Coauthor Index
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