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2010 – 2019
- 2016
[c25]Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos:
ETS 2016 foreword. ETS 2016: 1- 2015
- [c24]Bram Kruseman:
Testing of Analog/Mixed Signal ICs: Past, present and future. ETS 2015: 1 - 2013
- [j7]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 301-312 (2013) - [c23]Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman:
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS 2013: 1 - 2012
- [j6]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29(5): 72-80 (2012) - [j5]Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak:
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 809-813 (2012) - [j4]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman:
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61(10): 2701-2712 (2012) - 2011
- [j3]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1911-1922 (2011) - [j2]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2209-2220 (2011) - [c22]Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing:
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE 2011: 371-376 - [c21]Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui:
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145 - [c20]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for analog/mixed-signal devices. ITC 2011: 1-10 - 2010
- [c19]Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel:
NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE 2010: 1373-1376 - [c18]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out. ETS 2010: 233-238 - [c17]Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti:
Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
2000 – 2009
- 2008
- [c16]Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi:
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC 2008: 1-10 - [c15]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC 2008: 1-10 - [c14]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Full Open Defects in Nanometric CMOS. VTS 2008: 119-124 - 2007
- [j1]Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger:
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24(3): 226-234 (2007) - [c13]Bram Kruseman, Ananta K. Majhi, Guido Gronthoud:
On Performance Testing with Path Delay Patterns. VTS 2007: 29-34 - [c12]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150 - [c11]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166 - 2006
- [c10]Bram Kruseman, Manuel Heiligers:
On test conditions for the detection of open defects. DATE 2006: 896-901 - [c9]Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger:
Power Supply Noise in Delay Testing. ITC 2006: 1-10 - 2004
- [c8]Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger:
On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222 - [c7]Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede:
Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299 - [c6]Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge:
Trends in Testing Integrated Circuits. ITC 2004: 688-697 - 2003
- [c5]Bram Kruseman, Stefan van den Oetelaar:
Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875 - 2002
- [c4]Bram Kruseman, Stefan van den Oetelaar, Josep Rius:
Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973 - 2001
- [c3]Bram Kruseman, Rudger van Veen, Kees van Kaam:
The future of delta I_DDQ testing. ITC 2001: 101-110 - 2000
- [c2]Bram Kruseman:
Comparison of defect detection capabilities of current-based and voltage-based test methods. ETW 2000: 175-180
1990 – 1999
- 1999
- [c1]Bram Kruseman, Peter Janssen, Victor Zieren:
Transient current testing of 0.25 μm CMOS devices. ITC 1999: 47-56
Coauthor Index
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