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Stefan van den Oetelaar

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2000 – 2009

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2003
[c2]
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Bram Kruseman, Stefan van den Oetelaar:
Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC 2003: 866-875
2002
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Bram Kruseman, Stefan van den Oetelaar, Josep Rius:
Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973

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