default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDStefan Eichenberger
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2013
[j6]Daniel Arumí
, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 301-312 (2013)- 2011
- [j5]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1911-1922 (2011) - [j4]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2209-2220 (2011) - 2010
- [c18]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out. ETS 2010: 233-238 - [c17]Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger:
Defect-oriented cell-internal testing. ITC 2010: 285-294 - [c16]Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti:
Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
2000 – 2009
- 2009
- [c15]Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - 2008
- [c14]Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi:
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC 2008: 1-10 - [c13]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC 2008: 1-10 - [c12]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Full Open Defects in Nanometric CMOS. VTS 2008: 119-124 - 2007
- [j3]Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger:
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24(3): 226-234 (2007) - [c11]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150 - [c10]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166 - [i1]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. CoRR abs/0710.4693 (2007) - 2006
- [c9]Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger:
Power Supply Noise in Delay Testing. ITC 2006: 1-10 - 2005
- [c8]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443 - [c7]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory testing improvements through different stress conditions. ESSCIRC 2005: 299-302 - 2004
- [j2]Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker:
ITC 2003 Roundtable: Design for Manufacturability. IEEE Des. Test Comput. 21(2): 144-156 (2004) - [c6]Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger:
On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222 - [c5]Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede:
Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299 - [c4]Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52 - 2003
- [j1]Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electron. Test. 19(4): 369-376 (2003) - [c3]Stefan Eichenberger:
Design for Manufacturability - or the meaning of 'subtle'. ITC 2003: 1316 - [c2]Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger:
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350 - 2002
- [c1]Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg:
An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:18 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
