"Delay Defect Screening using Process Monitor Structures."

Subhasish Mitra et al. (2004)

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DOI: 10.1109/VTEST.2004.1299224

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52

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