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Marco Restifo
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2020 – today
- 2020
- [b1]Marco Restifo:
Reliability and Testing of Complex Safety-Critical Automotive SoC. Polytechnic University of Turin, Italy, 2020 - [c11]Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali:
Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS 2020: 1-6
2010 – 2019
- 2019
- [c10]F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, Gulio Zoppi:
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS 2019: 1-6 - [c9]Sara Carbonara, Paolo Bernardi, Marco Restifo:
A Hybrid In-Field Self-Test Technique for SoCs. DTIS 2019: 1-6 - [c8]Wim Dobbelaere, Marco Restifo, Peter Sarson:
Innovative Practices on Automotive Test. VTS 2019: 1 - 2018
- [j3]Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35(3): 46-53 (2018) - [j2]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini:
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34(1): 43-52 (2018) - [j1]Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini:
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14(1): 86-98 (2018) - [c7]Riccardo Cantoro, Andrea Firrincieli, Davide Piumatti, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda:
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications. LATS 2018: 1-6 - 2017
- [c6]Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini:
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE 2017: 646-649 - [c5]Andrea Marcelli, Marco Restifo, Ernesto Sánchez, Giovanni Squillero:
An evolutionary approach to hardware encryption and Trojan-horse mitigation. DATE 2017: 1593-1598 - [c4]Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti:
On-line software-based self-test for ECC of embedded RAM memories. DFT 2017: 1-6 - [c3]Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo:
Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS 2017: 1-6 - [c2]Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda:
On the in-field test of embedded memories. IOLTS 2017: 67-70 - [c1]Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello:
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS 2017: 1-6
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