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ORCIDPeter Sarson
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- affiliation: ams AG, Premstaetten, Austria
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2010 – 2019
- 2019
[j6]Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev:
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements. ACM Trans. Design Autom. Electr. Syst. 24(4): 45:1-45:16 (2019)- [c23]Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris
:
Automated Die Inking through On-line Machine Learning. IOLTS 2019: 27-32 - [c22]Wim Dobbelaere, Marco Restifo, Peter Sarson:
Innovative Practices on Automotive Test. VTS 2019: 1 - 2018
- [j5]Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi:
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. J. Electron. Test. 34(3): 215-232 (2018) - [j4]Peter Sarson, Tomonori Yanagida, Kosuke Machida:
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. J. Electron. Test. 34(3): 233-253 (2018) - [c21]Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, Peter Sarson:
Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard. IOLTS 2018: 287-290 - [c20]Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev:
Online information utility assessment for per-device adaptive test flow. VTS 2018: 1-6 - [c19]Peter Sarson, Tomonori Yanagida, Kosuke Machida:
Group delay measurement of frequency down-converter devices using chirped RF modulated signal. VTS 2018: 1-6 - [c18]Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson:
IP session on ISO26262 EDA. VTS 2018: 1 - [c17]Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner:
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. VTS 2018: 1-6 - [c16]Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson:
Special session on BIST/calibration of A/MS devices. VTS 2018: 1 - 2017
- [j3]Peter Sarson:
An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus. J. Electron. Test. 33(3): 283-294 (2017) - [j2]Peter Sarson, Haruo Kobayashi:
Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs. J. Electron. Test. 33(3): 295-303 (2017) - [j1]Peter G. Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger:
Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement Exercise. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1250-1260 (2017) - [c15]Josip Mikulic, Peter Sarson, Gregor Schatzberger, Adrijan Baric:
Fault-based test methodology for analog amplifier circuits. EWDTS 2017: 1-7 - [c14]Peter Sarson, Jeff Rearick:
Use models for extending IEEE 1687 to analog test. ITC 2017: 1-8 - [c13]Stephen Sunter, Peter Sarson:
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. ITC 2017: 1-7 - [c12]Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris:
Automated die inking: A pattern recognition-based approach. ITC 2017: 1-6 - [c11]Enea Bagalini, Jacopo Sini, Matteo Sonza Reorda, Massimo Violante, H. Klimesch, Peter Sarson:
An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard. LATS 2017: 1-6 - [c10]Peter Sarson:
Innovative practices session 7C automotive quality assurance. VTS 2017: 1 - [c9]Pete Sarson, Stefano Di Carlo:
Innovative practices session 5C automotive test solutions. VTS 2017: 1 - [c8]Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi:
A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm. VTS 2017: 1-6 - 2016
- [c7]Peter Sarson:
Group delay filter measurement using a chirp. ETS 2016: 1-2 - [c6]Peter Sarson:
Very low supply voltage room temperature test to screen low temperature soft blown fuse fails which result in a resistive bridge. ISQED 2016: 135-139 - [c5]Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng:
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC 2016: 1-10 - [c4]Peter Sarson:
Test time efficient group delay filter characterization technique using a discrete chirped excitation signal. ITC 2016: 1-6 - [c3]Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson:
Yield improvement of an EEPROM for automotive applications while maintaining high reliability. VTS 2016: 1-6 - 2014
- [c2]Peter Sarson:
RF filter characterization using a chirp. IDT 2014: 1-5 - 2013
- [c1]Peter Sarson, Gregor Schatzberger, Robert Seitz:
Automotive EEPROM Qualification and Cost Optimization. Asian Test Symposium 2013: 105-106
Coauthor Index
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