"Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement ..."

Peter G. Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger (2017)

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DOI: 10.1109/TVLSI.2016.2634589

access: closed

type: Journal Article

metadata version: 2020-03-11

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Peter G. Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger:
Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement Exercise. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1250-1260 (2017)

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