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2020 – today
- 2023
[c19]V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris:
Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. VTS 2023: 1-7- 2022
- [c18]Deepika Neethirajan, V. A. Niranjan
, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris:
Machine Learning-Based Overkill Reduction through Inter-Test Correlation. VTS 2022: 1-7
2010 – 2019
- 2019
- [c17]Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris:
Wafer-Level Adaptive Vmin Calibration Seed Forecasting. DATE 2019: 1673-1678 - 2018
- [c16]Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner:
Special session on machine learning: How will machine learning transform test? VTS 2018: 1 - 2017
- [j3]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017) - [c15]Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris:
Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS 2017: 1-4 - 2016
- [c14]Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
A machine learning approach to fab-of-origin attestation. ICCAD 2016: 92 - [c13]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing fabrication process signature for predicting yield across designs. ISCAS 2016: 898-901 - [c12]Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8 - [c11]Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8 - [c10]David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar:
Statistical outlier screening as a test solution health monitor. ITC 2016: 1-10 - [c9]Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS 2016: 1-6 - 2015
- [c8]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD 2015: 9-14 - [c7]Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield prognosis for fab-to-fab product migration. VTS 2015: 1-6 - 2014
- [c6]Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris:
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC 2014: 1-7 - 2013
- [c5]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6 - 2011
- [c4]Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10 - 2010
- [c3]Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli:
Adapting to adaptive testing. DATE 2010: 556-561
2000 – 2009
- 2009
- [j2]W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26(5): 64-73 (2009) - [j1]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009) - [c2]Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger:
Quality improvement and cost reduction using statistical outlier methods. ICCD 2009: 64-69 - 2005
- [c1]Amit Nahar, W. Robert Daasch, Suresh Subramaniam:
Burn-in reduction using principal component analysis. ITC 2005: 10
Coauthor Index
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