"Statistics in Semiconductor Test: Going beyond Yield."

W. Robert Daasch, C. Glenn Shirley, Amit Nahar (2009)

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DOI: 10.1109/MDT.2009.123

access: closed

type: Journal Article

metadata version: 2020-05-17

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W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26(5): 64-73 (2009)

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