"Harnessing process variations for optimizing wafer-level probe-test flow."

Ali Ahmadi et al. (2016)

> Home

Details and statistics

DOI: 10.1109/TEST.2016.7805835

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/AhmadiXNOPM16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/AhmadiXNOPM16
Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.