IEEE Design & Test of Computers, Volume 14

Volume 14, Number 1, January-March 1997

EIC Message

• 
  Keeping in touch: Reader survey results; planned e-mail survey. IEEE Des. Test Comput. 14(1): 4-5 (1997)

Interview-Design data standard

• 
  J. Wilson:
  CFI leads development of design data standard. 6, 91

News-JOLLY, BIST for embedded DRAM

• 
  News. IEEE Des. Test Comput. 14(1): 7, 90 (1997)

Guest Editor's Introduction

• 
  Marc E. Levitt:
  Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design. IEEE Des. Test Comput. 14(1): 8-9 (1997)

Ultrasparc Testability

• 
  Marc E. Levitt:
  Designing UltraSparc for Testability. 10-17

Memory Defect Mapping

• 
  Lynn Youngs, Siva Paramanandam:
  Mapping and Repairing Embedded-Memory Defects. 18-24

Features

• 
  Dilip K. Bhavsar, John H. Edmondson:
  Alpha 21164 Testability Strategy. 25-33
• 
  Jainendra Kumar:
  Prototyping the M68060 for Concurrent Verification. 34-41
• 
  Margarida F. Jacome, Viktor S. Lapinskii:
  NREC: Risk Assessment and Planning of Complex Designs. 42-49

Special Features

• 
  Robert Wu, Jerry Gerner, Richard Wheelus, Kevin Lew:
  Testing Logic-Intensive Memory ICs on Memory Testers. 50-54
• 
  Al Bailey, Tim Lada, Jim Preston:
  Collateral ASIC Test. 55-63
• 
  Ghassan Al Hayek, Yves Le Traon, Chantal Robach:
  Impact of System Partitioning on Test Cost. 64-74

A D&T Roundtable

• 
  Hardware-Software Codesign. 75-83

Panel Summaries-Asynchronous design, Intranets and EDA

• 
  Panel Summaries. IEEE Des. Test Comput. 14(1): 84-87 (1997)

Conference Reports-ATS 96, System Test Standards Committee

• 
  Conference Reports. IEEE Des. Test Comput. 14(1): 88-90 (1997)

DATC Newsletter

• 
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 14(1): 92-93 (1997)

TTTC Newsletter

• 
  Test Technology Tc Newsletter. IEEE Des. Test Comput. 14(1): 94-95 (1997)

The Last Byte-Teaching George about test

• 
  Scott Davidson:
  George learns test. 96-

Volume 14, Number 2, April-June 1997

Letters

• 
  VHDL fault injection questioned. IEEE Des. Test Comput. 14(2): 2-3 (1997)

News

• 
  News. IEEE Des. Test Comput. 14(2): 3- (1997)

Panel Summaries

• 
  Ivo Bolsens, Marco Cecchini:
  IP-based business conflicts. IEEE Des. Test Comput. 14(2): 4, 92 (1997)

A D&T Profile

• 
  Adventures in the Mainframe Trade. 5-13

Guest Editors' Introduction

• 
  Peter Marwedel, Carlos A. López-Barrio:
  Guest Editor's Introduction: Design, Design Automation, and Test in Europe. IEEE Des. Test Comput. 14(2): 14-15 (1997)

Cosimulation and Compilation

• 
  Clifford Liem, François Naçabal, Carlos A. Valderrama, Pierre G. Paulin, Ahmed Amine Jerraya:
  System-on-a-Chip Cosimulation and Compilation. 16-25

Ram Address Decoders

• 
  Manoj Sachdev:
  Open Defects in CMOS RAM Address Decoders. 26-33

Microsystem Cad

• 
  Jean-Michel Karam, Bernard Courtois, Hicham Boutamine:
  CAD Tools for Bridging Microsystems and Foundries. 34-39

High-Level Synthesis

• 
  Reinaldo A. Bergamaschi, Salil Raje:
  Observable Time Windows: Verifying High-Level Synthesis Results. 40-50

Features

• 
  Rolf Drechsler, Bernd Becker, Stefan Ruppertz:
  The K*BMD: A Verification Data Structure. 51-59

Parity Prediction

• 
  Michael Nicolaidis, Ricardo de Oliveira Duarte, Salvador Manich, Joan Figueras:
  Fault-Secure Parity Prediction Arithmetic Operators. 60-71

Digital System Design

• 
  Rajesh K. Gupta, Stan Y. Liao:
  Using a Programming Language for Digital System Design. 72-80

A D&T Roundtable

• 
  Testing Embedded Cores. 81-89

Author Guidelines

• 
  Author Guidelines IEEE Design & Test. IEEE Des. Test Comput. 14(2): 90-91 (1997)

DATC Newsletter

• 
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 14(2): 93- (1997)

TTTC Newsletter

• 
  Test Technology TC Newsletter. IEEE Des. Test Comput. 14(2): 94-95 (1997)

The Last Byte

• 
  Scott Davidson:
  Why projects are late. 96-

Volume 14, Number 3, July-September 1997

EIC Message-Welcome ITC 97 Attendees

• 
  About this super issue. IEEE Des. Test Comput. 14(3): 1- (1997)

News

• 
  News. IEEE Des. Test Comput. 14(3): 6, 122 (1997)

Panel Summaries

• 
  Luciano Lavagno, Nanette Collins:
  DAC 97 Panel: Next-Generation HDLs. IEEE Des. Test Comput. 14(3): 7-8 (1997)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 14(3): 8-10 (1997)

VTS 97 Keynote

• 
  Gadi Singer:
  The Future of Test and DFT. 11-14

Guest Editors' Introduction

• 
  Tony Ambler, Magdy S. Abadir:
  Design and Test Economics-An Extra Dimension. IEEE Des. Test Comput. 14(3): 15-16 (1997)

Feature

• 
  José M. Miranda:
  A BIST and Boundary-Scan Economics Framework. 17-23
• 
  James Debardelaben, Vijay K. Madisetti, Anthony J. Gadient:
  Incorporating Cost Modeling in Embedded-System Design. 24-35
• 
  Craig T. Pynn:
  Analyzing Manufacturing Test Costs. 36-40
• 
  Jon Turino:
  Test Economics in the 21st Century. 41-44
• 
  Magdy S. Abadir, Rohit Kapur:
  Cost-Driven Ranking of Memory Elements for Partial Intrusion. 45-50
• 
  Des Farren, Anthony P. Ambler:
  The Economics of System-Level Testing. 51-58

IC Diagnosis and Failure Analysis

• 
  Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson:
  IC Failure Analysis: Magic, Mystery, and Science. 59-69
• 
  Donald Staab, Eugene R. Hnatek:
  Diagnosing IC Failures in a Fast Environment. 70-75
• 
  David P. Vallett:
  IC Failure Analysis: The Importance of Test and Diagnostics. 76-82
• 
  Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena:
  Automated Diagnosis in Testing and Failure Analysis. 83-89
• 
  Keith Baker, Jos van Beers:
  Shmoo Plotting: The Black Art of IC Testing. 90-97
• 
  Robert C. Aitken:
  Modeling the Unmodelable: Algorithmic Fault Diagnosis. 98-103

Special Feature

• 
  Mario Zagar, Danko Basch:
  Microprocessor Architecture Design with ATLAS. 104-112
• 
  A D&T Roundtable: Built-In Self-Test for Designers. IEEE Des. Test Comput. 14(3): 113-121 (1997)

DATC Newsletter

• 
  Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 14(3): 123-125 (1997)

TTTC Newsletter

• 
  Test Technology Tc Newsletter. IEEE Des. Test Comput. 14(3): 126-127 (1997)

The Last Byte

• 
  Jerry M. Soden, Christopher L. Henderson:
  Still in the Stone Age? IEEE Des. Test Comput. 14(3): 128- (1997)

Volume 14, Number 4, October-December 1997

Message from the EIC

• 
  D&T to greet new EIC. IEEE Des. Test Comput. 14(4): 1- (1997)

Panel Summaries

• 
  Victor P. Nelson:
  Which tester is right for your MCM? IEEE Des. Test Comput. 14(4): 4-5 (1997)

Conference Reports

• 
  Conference Reports. IEEE Des. Test Comput. 14(4): 5-6 (1997)

A D&T Profile

• 
  Burton J. Smith:
  Burton Smith's Multithreaded Success Strategy. IEEE Des. Test Comput. 14(4): 7-13 (1997)

Guest Editors' Introduction

• 
  Yervant Zorian, Rajesh K. Gupta:
  Design and Test of Core-Based Systems on Chips. IEEE Des. Test Comput. 14(4): 14- (1997)

Feature

• 
  Rajesh K. Gupta, Yervant Zorian:
  Introducing Core-Based System Design. 15-25
• 
  Ann Marie Rincon, Cory Cherichetti, James A. Monzel, David R. Stauffer, Michael T. Trick:
  Core Design and System-on-a-Chip Integration. 26-35
• 
  Frank S. Eory:
  A Core-Based System-to-Silicon Design Methodology. 36-41
• 
  Vijay K. Madisetti, Lan Shen:
  Interface Design for Core-Based Systems. 42-51
• 
  Nur A. Touba, Bahram Pouya:
  Using Partial Isolation Rings to Test Core-Based Designs. 52-59
• 
  Mika Kuulusa, Jari Nurmi, Janne Takala, Pasi Ojala, Henrik Herranen:
  A Flexible DSP Core for Embedded Systems. 60-68
• 
  Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto, Enrico Macii, Massimo Poncino:
  Testing Core-Based Systems: A Symbolic Methodology. 69-77

Special Feature

• 
  Keith A. Jenkins:
  Detecting and Preventing Measurement Errors. 78-86
• 
  Al Crouch, Jeff Freeman:
  Designing and Verifying Embedded Microprocessors. 87-94
• 
  A D&T Roundtable: What's Next for Microelectronics Education? IEEE Des. Test Comput. 14(4): 95-102 (1997)

IEEE Design & Test of Computers: 1997 Annual Index, Volume 14

• 
  IEEE Design & Test of Computers: 1997 Annual Index, Volume 14. IEEE Des. Test Comput. 14(4): 103-107 (1997)

DDATC Newsletter

• 
  DDATC Newsletter. IEEE Des. Test Comput. 14(4): 108-109 (1997)

TTTC Newsletter

• 
  Tttc Newsletter. IEEE Des. Test Comput. 14(4): 110-111 (1997)

The Last Byte

• 
  Lee Whetsel:
  A silicon El Niño? IEEE Des. Test Comput. 14(4): 112- (1997)