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ORCIDVictor P. Nelson
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2010 – 2019
- 2017
[c11]Victor P. Nelson, Eric Durant, John Impagliazzo, Joseph L. A. Hughes:
CE2016: Updated curricular guidelines for computer engineering. FIE 2017: 1-6- 2015
- [j32]Susan Conry, Eric Durant, Herman Lam, Victor P. Nelson, Robert B. Reese:
CE2016 steering committee: a short update. Inroads 6(1): 62 (2015) - [c10]Eric Durant, John Impagliazzo, Susan Conry, Robert B. Reese, Herman Lam, Victor P. Nelson, Joseph L. Hughes, Weidong Liu, Junlin Lu, Andrew D. McGettrick:
CE2016: Updated computer engineering curriculum guidelines. FIE 2015: 1-2 - 2014
- [c9]Eric Durant, John Impagliazzo, Susan Conry, Robert B. Reese, Mitchell A. Thornton
, Herman Lam, Victor P. Nelson:
Setting the stage for CE2016: A revised body of knowledge. FIE 2014: 1-4
2000 – 2009
- 2009
- [c8]George J. Starr, J. M. Wersinger, Richard Chapman, Lloyd Riggs, Victor P. Nelson, John Klingelhoeffer, Charles E. Stroud:
Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies. ESA 2009: 9-15 - [c7]George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Foster F. Dai, Victor P. Nelson:
Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems. DFT 2009: 11-19 - 2003
- [j31]Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Trans. Reliab. 52(3): 296-300 (2003) - 2001
- [c6]Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. DFT 2001: 29-38 - [c5]Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Estimating burn-in fall-out for redundant memory. ITC 2001: 340-347 - [c4]Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. VTS 2001: 326-332
1990 – 1999
- 1998
- [j30]Christopher G. Knight, Adit D. Singh, Victor P. Nelson:
An IDDQ sensor for concurrent timing error detection. IEEE J. Solid State Circuits 33(10): 1545-1550 (1998) - 1997
- [j29]Victor P. Nelson:
Which tester is right for your MCM? IEEE Des. Test Comput. 14(4): 4-5 (1997) - [c3]Christopher G. Knight, Adit D. Singh, Victor P. Nelson:
An IDDQ Sensor for Concurrent Timing Error Detection. DFT 1997: 281-289 - 1991
- [j28]Chia-Jiu Wang, Chwan-Hwa John Wu, Victor P. Nelson:
A Study of the Generalized Multiple Bus-Connected Parallel Computer. Comput. J. 34(Additional-Papers): A089-A094 (1991) - [j27]Chia-Jiu Wang, Victor P. Nelson:
Petri net performance modeling of a modified mesh-connected parallel computer. Parallel Comput. 17(1): 75-84 (1991) - 1990
- [j26]Victor P. Nelson:
Fault-Tolerant Computing: Fundamental Concepts. Computer 23(7): 19-25 (1990)
1980 – 1989
- 1989
- [c2]Chia-Jiu Wang, Victor P. Nelson, Chwan-Hwa John Wu:
Performance modeling of the modified mesh-connected parallel computer. ICDCS 1989: 490-497 - 1988
- [j25]Charles R. Bisbee, Victor P. Nelson:
Failure dependent bandwidth in shuffle-exchange networks. IEEE Trans. Computers 37(6): 853-858 (1988) - 1985
- [j24]Victor P. Nelson:
New Products. IEEE Micro 5(1): 76-82 (1985) - [j23]Victor P. Nelson:
New Products. IEEE Micro 5(2): 95-100 (1985) - [j22]Victor P. Nelson:
New Products. IEEE Micro 5(3): 86-93 (1985) - 1984
- [j21]Victor P. Nelson:
New Products. IEEE Micro 4(1): 86-88 (1984) - [j20]Victor P. Nelson:
New Products. IEEE Micro 4(2): 72-76 (1984) - [j19]Victor P. Nelson:
New Products. IEEE Micro 4(3): 75-80 (1984) - [j18]Victor P. Nelson:
New Products. IEEE Micro 4(4): 123-126 (1984) - [j17]Victor P. Nelson:
New Products. IEEE Micro 4(5): 73-79 (1984) - [j16]Victor P. Nelson:
New Products. IEEE Micro 4(6): 90-93 (1984) - 1983
- [j15]Victor P. Nelson:
New Products. IEEE Micro 3(1): 72-75 (1983) - [j14]Victor P. Nelson:
New Products. IEEE Micro 3(2): 62-67 (1983) - [j13]Victor P. Nelson:
New Products. IEEE Micro 3(3): 69-74 (1983) - [j12]Victor P. Nelson:
New Products. IEEE Micro 3(4): 93-95 (1983) - [j11]Victor P. Nelson:
New Products. IEEE Micro 3(5): 59-64 (1983) - [j10]Victor P. Nelson:
New Products. IEEE Micro 3(6): 74-78 (1983) - 1982
- [j9]Victor P. Nelson:
New Products. IEEE Micro 2(1): 76-82 (1982) - [j8]Victor P. Nelson:
New Products. IEEE Micro 2(2): 88-98 (1982) - [j7]Victor P. Nelson:
New Products. IEEE Micro 2(3): 97-101 (1982) - [j6]Victor P. Nelson:
New Products. IEEE Micro 2(4): 80-83 (1982) - 1981
- [j5]H. Troy Nagle, Victor P. Nelson:
Digital Filter Implementation on 16-Bit Microcomputers. IEEE Micro 1(1): 23-41 (1981) - [j4]Victor P. Nelson, Hugh L. Fellows:
A Microcomputer-Based Controller for an Amusement Park Ride. IEEE Micro 1(3): 13-22 (1981) - [j3]Victor P. Nelson:
New Products. IEEE Micro 1(3): 70-74 (1981) - [j2]Victor P. Nelson:
New Products. IEEE Micro 1(4): 80-85 (1981) - [j1]Suchai Thanawastien, Victor P. Nelson:
Interference Analysis of Shuffle/Exchange Networks. IEEE Trans. Computers 30(8): 545-556 (1981) - 1980
- [c1]D. V. Satishchandra, Victor P. Nelson:
A Reconfigurable Distributed Digital Filter. RTSS 1980: 90-96
Coauthor Index
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