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José M. Miranda

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2000 – 2009

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2005
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Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda:
JTAG-based vector and chain management for system test. ITC 2005: 10
2003
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Bradford G. Van Treuren, José M. Miranda:
Embedded Boundary Scan. IEEE Des. Test Comput. 20(2): 20-25 (2003)

1990 – 1999

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1998
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José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman:
Test Reuse at System Level. VTS 1998: 318-319
1997
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José M. Miranda:
A BIST and Boundary-Scan Economics Framework. IEEE Des. Test Comput. 14(3): 17-23 (1997)

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