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Eugene R. Hnatek
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1990 – 1999
- 1997
- [j5]Donald Staab, Eugene R. Hnatek:
Diagnosing IC Failures in a Fast Environment. IEEE Des. Test Comput. 14(3): 70-75 (1997) - 1995
- [c8]Alex M. Ijaz, Eugene R. Hnatek:
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. ITC 1995: 233-241 - 1993
- [c7]Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz:
Application of Statistical Techniques to Critical System Parameters. ITC 1993: 108-114
1980 – 1989
- 1989
- [c6]Eugene R. Hnatek, Billy R. Livesay:
Quality Issues of High Pin Count Fine Pitch VLSI Packages. ITC 1989: 397-422 - 1986
- [c5]Eugene R. Hnatek:
IC Burn-In : The Changing Scene. ITC 1986: 228-231 - 1984
- [c4]Eugene R. Hnatek:
Thoughts on VLSI Burn-in. ITC 1984: 531-535 - [c3]Beau R. Wilson Jr., Eugene R. Hnatek:
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788 - 1982
- [c2]Eugene R. Hnatek, Beau R. Wilson Jr.:
An Evaluation of the 2816 EEPROM. ITC 1982: 225-235 - 1981
- [c1]Eugene R. Hnatek:
Documentation for Testability : The Supplier's Responsibility to the User. ITC 1981: 370-372
1970 – 1979
- 1977
- [j4]Eugene R. Hnatek:
Microprocessor-digital converter applications. Microprocess. 1(4): 222-230 (1977) - [j3]Eugene R. Hnatek:
Microprocessor device reliability. Microprocess. 1(5): 299-303 (1977) - [j2]Eugene R. Hnatek:
Physics of computer memory devices: S Middelhoek, P K George and P Dekker. Academic Press (1976), 402 pp, £12.50. Microprocess. 1(5): 337-338 (1977) - 1976
- [j1]Eugene R. Hnatek:
Semiconductor memories: A review. Microprocess. 1(2): 85-98 (1976)
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