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ORCIDDon E. Ross
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2000 – 2009
- 2004
[c13]Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk:
Memory BIST Using ESP. VTS 2004: 243-248- 2000
- [c12]Don E. Ross, Tim Wood, Grady Giles:
Conversion of small functional test sets of nonscan blocks to scan patterns. ITC 2000: 691-700
1990 – 1999
- 1995
- [j2]Murali M. R. Gala, Don E. Ross, Karan L. Watson
, Beena Vasudevan, Peter Utama:
Built-in self test for C-testable ILA's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(11): 1388-1398 (1995) - [c11]Jawahar Jain, Dinos Moundanos, James R. Bitner, Jacob A. Abraham, Donald S. Fussell, Don E. Ross:
Efficient variable ordering and partial representation algorithm. VLSI Design 1995: 81-86 - 1994
- [c10]Murali M. R. Gala, Peter Utama, Don E. Ross, Karan L. Watson:
Linear finite state machine for lD ILAs. VTS 1994: 325-332 - 1993
- [c9]Sherif H. K. Embabi, R. Damodaran, R. Bhagwan, Don E. Ross:
An Accurate Delay Model for BiCMOS Gates and Off-chip Drivers. ISCAS 1993: 1539-1542 - [c8]Murali M. R. Gala, Karan L. Watson, Don E. Ross:
Testability of one dimensional ILAs under multiple faults. VTS 1993: 178-181 - [c7]Ravishankar Kodavarti, Don E. Ross:
Signal probability calculations using partial functional manipulation. VTS 1993: 194-200 - [c6]Beena Vasudevan, Don E. Ross, Murali M. R. Gala, Karan L. Watson:
LFSR based deterministic hardware for at-speed BIST. VTS 1993: 201-207 - 1992
- [c5]M. Ray Mercer, Rohit Kapur, Don E. Ross:
Functional Approaches to Generating Orderings for Efficient Symbolic Representations. DAC 1992: 624-627 - [c4]Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross:
The roles of controllability and observability in design for test. VTS 1992: 211-216 - 1991
- [j1]Don E. Ross, Kenneth M. Butler, M. Ray Mercer:
Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electron. Test. 2(3): 243-259 (1991) - [c3]Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer:
Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420 - [c2]Don E. Ross, Kenneth M. Butler, Rohit Kapur, M. Ray Mercer:
Fast functional evaluation of candidate OBDD variable orderings. EURO-DAC 1991: 4-10
1980 – 1989
- 1988
- [c1]Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler:
CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC 1988: 597-600
Coauthor Index
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