"Accurate ADC testing with significantly relaxed instrumentation including ..."

Li Xu et al. (2017)

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DOI: 10.1109/TEST.2017.8242057

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen:
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC 2017: 1-10

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