"Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs."

Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang (2003)

> Home

Details and statistics

DOI: 10.1109/MDT.2003.1232250

access: closed

type: Journal Article

metadata version: 2022-12-07

- view
  authority control:
- export record
  dblp key:
  - journals/dt/ButlerCW03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/ButlerCW03
Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang:
Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Des. Test Comput. 20(5): 6-7 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.