"Scan-Based Transition Fault Testing - Implementation and Low Cost Test ..."

Jayashree Saxena et al. (2002)

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DOI: 10.1109/TEST.2002.1041869

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech:
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129

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