"On applying non-classical defect models to automated diagnosis."

Jayashree Saxena et al. (1998)

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DOI: 10.1109/TEST.1998.743256

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/SaxenaBBLLFC98
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SaxenaBBLLFC98
Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess:
On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757

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