"Automatic test generation for linear digital systems with bi-level search ..."

Rabindra K. Roy et al. (1992)

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DOI: 10.1109/ICCAD.1992.279370

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu:
Automatic test generation for linear digital systems with bi-level search using matrix transform methods. ICCAD 1992: 224-228

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