"Application of Simple Genetic Algorithms to Sequential Circuit Test ..."

Elizabeth M. Rudnick et al. (1994)

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DOI: 10.1109/EDTC.1994.326901

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Elizabeth M. Rudnick, John G. Holm, Daniel G. Saab, Janak H. Patel:
Application of Simple Genetic Algorithms to Sequential Circuit Test Generation. EDAC-ETC-EUROASIC 1994: 40-45

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