"Compaction of ATPG-generated test sequences for sequential circuits."

Rabindra K. Roy et al. (1988)

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DOI: 10.1109/ICCAD.1988.122533

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rabindra K. Roy, Thomas M. Niermann, Janak H. Patel, Jacob A. Abraham, Resve A. Saleh:
Compaction of ATPG-generated test sequences for sequential circuits. ICCAD 1988: 382-385

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