"BiCMOS logic testing."

Marc E. Levitt, Kaushik Roy, Jacob A. Abraham (1994)

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DOI: 10.1109/92.285749

access: closed

type: Journal Article

metadata version: 2020-03-11

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Marc E. Levitt, Kaushik Roy, Jacob A. Abraham:
BiCMOS logic testing. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 241-248 (1994)

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