"Test set selection for structural faults in analog IC's."

Giri Devarayanadurg et al. (1999)

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DOI: 10.1109/43.771183

access: closed

type: Journal Article

metadata version: 2020-09-24

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Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh:
Test set selection for structural faults in analog IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7): 1026-1039 (1999)

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