"Key Technologies for 500 MHz VLSI Test System "ULTIMATE"."

Teruo Tamama et al. (1988)

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DOI: 10.1109/TEST.1988.207787

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Teruo Tamama, Naoaki Narumi, Taiichi Otsuji, Masao Suzuki, Tsuneta Sudo:
Key Technologies for 500 MHz VLSI Test System "ULTIMATE". ITC 1988: 108-113

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