"An Incomplete Scan Design Approach to Test Generation for Sequential Machines."

Hi-Keung Tony Ma et al. (1988)

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DOI: 10.1109/TEST.1988.207858

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Hi-Keung Tony Ma, A. Richard Newton, Srinivas Devadas, Alberto L. Sangiovanni-Vincentelli:
An Incomplete Scan Design Approach to Test Generation for Sequential Machines. ITC 1988: 730-734

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