"Designs for Diagnosability and Reliability in VLSI Systems."

Stephen Y. H. Su, Hede Ma (1988)

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DOI: 10.1109/TEST.1988.207877

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Stephen Y. H. Su, Hede Ma:
Designs for Diagnosability and Reliability in VLSI Systems. ITC 1988: 888-897

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