"Packaging Technologies for the 500 MHz VLSI Test System "ULTIMATE"."

Yoshimitsu Sakagawa et al. (1988)

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DOI: 10.1109/TEST.1988.207789

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Yoshimitsu Sakagawa, Yusio Akazawa, Naoaki Narumi, Akira Yoshii, Tsuneta Sudo:
Packaging Technologies for the 500 MHz VLSI Test System "ULTIMATE". ITC 1988: 120-125

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