"DC_IATP : An Iterative Analog Circuit Test Generation Program for ..."

M. J. Marlett, Jacob A. Abraham (1988)

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DOI: 10.1109/TEST.1988.207871

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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M. J. Marlett, Jacob A. Abraham:
DC_IATP : An Iterative Analog Circuit Test Generation Program for Generating DC Single Pattern Tests. ITC 1988: 839-844

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