"Design for Testability of Mixed Signal Integrated Circuits."

Kenneth D. Wagner, Thomas W. Williams (1988)

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DOI: 10.1109/TEST.1988.207869

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Kenneth D. Wagner, Thomas W. Williams:
Design for Testability of Mixed Signal Integrated Circuits. ITC 1988: 823-828

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