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ORCIDAlexandra L. Zimpeck
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Journal Articles
- 2024
[j10]Alexandra L. Zimpeck
, Alexander Fish:
Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023). IEEE Trans. Circuits Syst. I Regul. Pap. 71(3): 985-986 (2024)- 2023
- [j9]Cleber S. Peter, Lucas Penning, Alexandra L. Zimpeck, Felipe Marques, Adenauer C. Yamin:
An Approach to Remote Update Embedded Systems in the Internet of Things. J. Internet Serv. Appl. 14(1): 151-159 (2023) - [j8]Gerson D. Andrade, Matheus Silva, Cínthia Schneider, Guilherme Paim, Sergio Bampi, Eduardo Costa, Alexandra L. Zimpeck:
Robustness Analysis of 3-2 Adder Compressor Designed in 7-nm FinFET Technology. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 1264-1268 (2023) - 2022
- [j7]Fábio G. R. G. da Silva, Rafael N. M. Oliveira, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology. Integr. 87: 137-146 (2022) - 2020
- [j6]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(2): 553-564 (2020) - 2018
- [j5]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Impact of different transistor arrangements on gate variability. Microelectron. Reliab. 88-90: 111-115 (2018) - [j4]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Evaluation of variability using Schmitt trigger on full adders layout. Microelectron. Reliab. 88-90: 116-121 (2018) - 2016
- [j3]Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Permanent and single event transient faults reliability evaluation EDA tool. Microelectron. Reliab. 64: 63-67 (2016) - 2015
- [j2]Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Impact of PVT variability on 20 nm FinFET standard cells. Microelectron. Reliab. 55(9-10): 1379-1383 (2015) - 2014
- [j1]Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo A. L. Reis:
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations. Microelectron. Reliab. 54(9-10): 2319-2324 (2014)
Conference and Workshop Papers
- 2023
- [c32]Gabriel Lima Jacinto, Cínthia Schneider, Alexandra L. Zimpeck, Mateus Grellert, Cristina Meinhardt:
Fast and Low-Error Prediction of Logic Gate Cell Characterization. ICECS 2023: 1-4 - [c31]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt:
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS 2023: 1-5 - [c30]Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt:
A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI 2023: 1-6 - 2021
- [c29]Gerson D. Andrade, Ricardo A. L. Reis, Eduardo A. C. da Costa, Alexandra L. Zimpeck:
Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy. APCCAS 2021: 37-40 - [c28]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS 2021: 1-4 - [c27]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Current Behavior on Process Variability Aware FinFET Inverter Designs. LASCAS 2021: 1-4 - [c26]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt:
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS 2021: 1-6 - 2020
- [c25]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Pros and Cons of ST and SIG FinFET Inverters for Low Power Designs. ISCAS 2020: 1-5 - [c24]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS 2020: 1-6 - [c23]Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes:
Circuit Level Design Methods to Mitigate Soft Errors. LATS 2020: 1-3 - 2019
- [c22]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. ICECS 2019: 582-585 - [c21]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Exploring Schmitt Trigger Circuits for Process Variability Mitigation. NEWCAS 2019: 1-4 - [c20]Leonardo B. Moraes, Alexandra Lackmann Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Robust FinFET Schmitt Trigger Designs for Low Power Applications. VLSI-SoC (Selected Papers) 2019: 45-68 - [c19]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability. VLSI-SoC 2019: 88-93 - [c18]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) 2019: 89-113 - [c17]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC 2019: 179-184 - [c16]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC 2019: 240-241 - [c15]Leonardo B. Moraes, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Robustness and Minimum Energy-Oriented FinFET Design. VLSI-SoC 2019: 247-248 - [c14]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC 2019: 249-250 - 2018
- [c13]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS 2018: 581-584 - [c12]Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt:
Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders. ISCAS 2018: 1-5 - [c11]Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC 2018: 71-76 - 2017
- [c10]Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. ICECS 2017: 270-273 - [c9]Samuel Presa Toledo, Alexandra L. Zimpeck, Ricardo Reis, Cristina Meinhardt:
Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders. ICECS 2017: 290-293 - [c8]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Robustness of Sub-22nm multigate devices against physical variability. ISCAS 2017: 1-4 - 2016
- [c7]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Geometric variability impact on 7nm Trigate combinational cells. ICECS 2016: 9-12 - [c6]Alexandra L. Zimpeck, Ricardo Reis:
Impact of variability effects on FinFET transistors and combinational cells. ICECS 2016: 440-441 - [c5]Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Augusto da Luz Reis:
FinFET cells with different transistor sizing techniques against PVT variations. ISCAS 2016: 45-48 - 2015
- [c4]Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis:
Process variability in FinFET standard cells with different transistor sizing techniques. ICECS 2015: 121-124 - [c3]Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis:
Analyzing the Impact of Frequency and Diverse Path Delays in the Time Vulnerability Factor of Master-Slave D Flip-Flops. ISVLSI 2015: 521-526 - 2014
- [c2]Cristina Meinhardt, Alexandra L. Zimpeck, Ricardo Augusto da Luz Reis:
Impact of gate workfunction fluctuation on FinFET standard cells. ICECS 2014: 574-577 - [c1]Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis:
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices. PATMOS 2014: 1-8
Coauthor Index
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