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ORCIDGuillaume Hubert
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2020 – today
- 2024
[c18]Nasr-Eddine Ouldei Tebina, Luc Salvo, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri:
Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification. DATE 2024: 1-6- [c17]Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri:
Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation. HOST 2024: 1-11 - [c16]Anaïs Tilhac, Guillaume Hubert, Solène Derrien, Fabienne Lohou:
Contribution of neutron spectrometry to monitor soil water content in an area subject to strong seasonal variations. IGARSS 2024: 5143-5146 - 2023
- [j10]Juan Carlos Fabero
, Golnaz Korkian, Francisco J. Franco, Guillaume Hubert, Hortensia Mecha, Manon Letiche, Juan Antonio Clemente:
SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles. Microprocess. Microsystems 96: 104743 (2023) - [c15]Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri:
Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. DFT 2023: 1-6 - [c14]Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri:
Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection. IOLTS 2023: 1-7 - 2022
- [c13]Angeliki Kritikakou, Olivier Sentieys, Guillaume Hubert, Youri Helen, Jean-Francois Coulon, Patrice Deroux-Dauphin:
Flodam: Cross-Layer Reliability Analysis Flow for Complex Hardware Designs. DATE 2022: 819-824 - [c12]William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre:
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. IOLTS 2022: 1-5 - 2021
- [j9]Guillaume Hubert, Sébastien Aubry:
Simulation of atmospheric cosmic-rays and their impacts based on pre-calculated databases, physical models and computational methods. J. Comput. Sci. 51: 101307 (2021) - [c11]William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert:
Further Analysis of Laser-induced IR-drop. ATS 2021: 91-96 - 2020
- [j8]Adriane Cristina Mendes Prado, Mauricio Tizziani Pazianotto, José Manuel Quesada Molina, Miguel Antonio Cortes-Giraldo, Guillaume Hubert, Marlon Antonio Pereira, Claudio Antonio Federico:
Simulation of Cosmic Radiation Transport Inside Aircraft for Safety Applications. IEEE Trans. Aerosp. Electron. Syst. 56(5): 3462-3475 (2020) - [j7]Guillaume Hubert, Sébastien Aubry, Juan Antonio Clemente:
Impact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics. IEEE Trans. Aerosp. Electron. Syst. 56(5): 3674-3684 (2020) - [c10]William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert:
Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. SBCCI 2020: 1-6
2010 – 2019
- 2019
- [c9]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. ICECS 2019: 582-585 - [c8]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC 2019: 240-241 - 2018
- [j6]Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Impact of different transistor arrangements on gate variability. Microelectron. Reliab. 88-90: 111-115 (2018) - [j5]Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey:
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18(7): 2338 (2018) - 2017
- [j4]Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. 76-77: 660-664 (2017) - [j3]Antoine Sauvage, Guillaume Hubert, Jonathan Touboul, Jérôme Ribot:
The hemodynamic signal as a first-order low-pass temporal filter: Evidence and implications for neuroimaging studies. NeuroImage 155: 394-405 (2017) - 2015
- [j2]Guillaume Hubert, Laurent Artola, D. Regis:
Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation. Integr. 50: 39-47 (2015) - 2014
- [j1]Laurent Artola, Guillaume Hubert, Massimo Alioto:
Comparative soft error evaluation of layout cells in FinFET technology. Microelectron. Reliab. 54(9-10): 2300-2305 (2014) - [c7]Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Guillaume Hubert:
Layout-aware laser fault injection simulation and modeling: From physical level to gate level. DTIS 2014: 1-6 - [c6]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c5]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240
2000 – 2009
- 2009
- [c4]Guillaume Hubert, Raoul Velazco, Paul Peronnard:
A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations. IOLTS 2009: 180 - 2007
- [c3]Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS 2007: 137-145 - 2006
- [c2]Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS 2006: 63-74 - 2005
- [c1]Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard:
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS 2005: 87-94
Coauthor Index
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