"Laser-Induced Fault Effects in Security-Dedicated Circuits."

Vincent Beroulle et al. (2014)

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DOI: 10.1007/978-3-319-25279-7_12

access: open

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240

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