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ORCIDPhilippe Candelier
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2010 – 2019
- 2018
[c13]Jean-Max Dutertre
, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6- [c12]Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS 2018: 214-219 - 2016
- [j2]Noemie Beringuier-Boher, Vincent Beroulle, David Hély, Joel Damiens, Philippe Candelier:
Clock generator behavioral modeling for supply voltage glitch attack effects analysis. Microprocess. Microsystems 47: 37-43 (2016) - 2015
- [c11]M. Azzaz, A. Benoist, Elisa Vianello, Daniele Garbin, Eric Jalaguier, Carlo Cagli, C. Charpin, Stefania Bernasconi, Simon Jeannot, T. Dewolf, G. Audoit, C. Guedj, S. Denorme, Philippe Candelier, Claire Fenouillet-Béranger, Luca Perniola:
Benefit of Al2O3/HfO2 bilayer for BEOL RRAM integration through 16kb memory cut characterization. ESSDERC 2015: 266-269 - [c10]A. Benoist, S. Denorme, X. Federspiel, Bruno Allard, Philippe Candelier:
Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. IRPS 2015: 3 - [c9]Daniele Garbin, Elisa Vianello, Olivier Bichler, M. Azzaz, Quentin Rafhay, Philippe Candelier, Christian Gamrat, Gérard Ghibaudo, Barbara De Salvo, Luca Perniola:
On the impact of OxRAM-based synapses variability on convolutional neural networks performance. NANOARCH 2015: 193-198 - 2014
- [c8]Noemie Beringuier-Boher, Kamil Gomina, David Hély, Jean-Baptiste Rigaud, Vincent Beroulle, Assia Tria, Joel Damiens, Philippe Gendrier, Philippe Candelier:
Voltage Glitch Attacks on Mixed-Signal Systems. DSD 2014: 379-386 - [c7]Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale:
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS 2014: 1-6 - [c6]Kamil Gomina, Philippe Gendrier, Philippe Candelier, Jean-Baptiste Rigaud, Assia Tria:
Detecting positive voltage attacks on CMOS circuits. CS2@HiPEAC 2014: 1-6 - [c5]Kamil Gomina, Jean-Baptiste Rigaud, Philippe Gendrier, Philippe Candelier, Assia Tria:
Power supply glitch attacks: Design and evaluation of detection circuits. HOST 2014: 136-141 - [c4]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c3]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert:
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240 - 2013
- [c2]Kamil Gomina, Jean-Baptiste Rigaud, Philippe Gendrier, Philippe Candelier, Assia Tria:
Power analysis methodology for secure circuits. DDECS 2013: 102-107 - [c1]Noemie Beringuier-Boher, David Hély, Vincent Beroulle, Joel Damiens, Philippe Candelier:
Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology. ISQED 2013: 531-537
2000 – 2009
- 2009
- [j1]Elodie Ebrard, Bruno Allard, Philippe Candelier, Patrice Waltz:
Review of fuse and antifuse solutions for advanced standard CMOS technologies. Microelectron. J. 40(12): 1755-1765 (2009)
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