"Laser-induced fault effects in security-dedicated circuits."

Régis Leveugle et al. (2014)

> Home

Details and statistics

DOI: 10.1109/VLSI-SOC.2014.7004184

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/LeveugleMVLNFRPHBHCDSBLDCT14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/LeveugleMVLNFRPHBHCDSBLDCT14
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier:
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.